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William A. McGahan
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Spicewood, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Scatterometry measurement of asymmetric structures
Patent number
8,525,993
Issue date
Sep 3, 2013
Nanometrics Incorporated
Silvio J. Rabello
G01 - MEASURING TESTING
Information
Patent Grant
Simulating two-dimensional periodic patterns using compressed fouri...
Patent number
8,170,838
Issue date
May 1, 2012
Nanometrics Incorporated
Silvio J. Rabello
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Spectrometer measurement of diffracting structures
Patent number
7,372,565
Issue date
May 13, 2008
Nanometrics Incorporated
James M. Holden
G01 - MEASURING TESTING
Information
Patent Grant
Modeling a sample with an underlying complicated structure
Patent number
7,202,958
Issue date
Apr 10, 2007
Nanometrics Incorporated
William A. McGahan
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for the measurement of diffracting structures
Patent number
7,115,858
Issue date
Oct 3, 2006
Nanometrics Incorporated
James M. Holden
G01 - MEASURING TESTING
Information
Patent Grant
Measurement of diffracting structures using one-half of the non-zer...
Patent number
6,898,537
Issue date
May 24, 2005
Nanometrics Incorporated
William A. McGahan
G01 - MEASURING TESTING
Information
Patent Grant
Elemental concentration measuring methods and instruments
Patent number
6,381,009
Issue date
Apr 30, 2002
Nanometrics Incorporated
William A. McGahan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Spectroscopic Reflectometry And Ellipsometry Measurements With Elec...
Publication number
20230109008
Publication date
Apr 6, 2023
KLA Corporation
William McGahan
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Scatterometry Measurement of Asymmetric Structures
Publication number
20110080585
Publication date
Apr 7, 2011
Nanometrics Incorporated
Silvio J. Rabello
G01 - MEASURING TESTING
Information
Patent Application
Simulating Two-Dimensional Periodic Patterns Using Compressed Fouri...
Publication number
20100274521
Publication date
Oct 28, 2010
Nanometrics Incorporated
Silvio J. Rabello
G06 - COMPUTING CALCULATING COUNTING