William B. Maloney

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Creating scan chain definition from high-level model using high-lev...
- Patent number 8,281,279
- Issue date Oct 2, 2012
- International Business Machines Corporation
- William B. Maloney
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of untestable faults using discrete node sets
- Patent number 5,548,715
- Issue date Aug 20, 1996
- International Business Machines Corporation
- William B. Maloney
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Creating Scan Chain Definition from High-Level Model Using High-Lev...
- Publication number 20120151288
- Publication date Jun 14, 2012
- International Business Machines Corporation
- William B. Maloney
- G06 - COMPUTING CALCULATING COUNTING