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William Bartling
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Bakersfield, CA, US
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last 30 patents
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Patent Application
Interferometric Microseismic Imaging Methods and Apparatus
Publication number
20180203144
Publication date
Jul 19, 2018
OPTASENSE, INC.
Martin Karrenbach
G01 - MEASURING TESTING
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Patent Application
Progressive 3D Vertical Seismic Profiling Method
Publication number
20140257707
Publication date
Sep 11, 2014
SR2020, INC.
Andres Chavarria
G01 - MEASURING TESTING
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Patent Application
Progressive 3D vertical seismic profiling method
Publication number
20100118655
Publication date
May 13, 2010
Andres Chavarria
G01 - MEASURING TESTING