William BOYER

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Ypsilanti, MI, US

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Patents Grantslast 30 patents

Information Patent Grant
Mounting system and sample holder for X-ray diffraction apparatus
- Patent number 11,346,794
- Issue date May 31, 2022
- PROTO PATENTS LTD.
- Vedran Nicholas Vukotic
- G01 - MEASURING TESTING
Information Patent Grant
Mounting system and sample holder for X-ray diffraction apparatus
- Patent number 10,794,844
- Issue date Oct 6, 2020
- PROTO MANUFACTURING, LTD.
- Vedran Nicholas Vukotic
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MOUNTING SYSTEM AND SAMPLE HOLDER FOR X-RAY DIFFRACTION APPARATUS
- Publication number 20210055236
- Publication date Feb 25, 2021
- Proto Manufacturing Ltd.
- Vedran Nicholas VUKOTIC
- G01 - MEASURING TESTING
Information Patent Application
MOUNTING SYSTEM AND SAMPLE HOLDER FOR X-RAY DIFFRACTION APPARATUS
- Publication number 20190178823
- Publication date Jun 13, 2019
- Proto Manufacturing Ltd.
- Vedran Nicholas VUKOTIC
- G01 - MEASURING TESTING