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William C. Hay
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Happenheim, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Raman microscopic imaging device
Patent number
10,386,303
Issue date
Aug 20, 2019
Leica Microsystems CMS GmbH
Vishnu Vardhan Krishnamachari
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for illuminating a sample
Patent number
10,132,754
Issue date
Nov 20, 2018
Leica Microsystems CMS GmbH
Vishnu Vardhan Krishnamachari
G02 - OPTICS
Information
Patent Grant
Tunable multiple laser pulse scanning microscope and method of oper...
Patent number
8,610,996
Issue date
Dec 17, 2013
Leica Microsystems CMS GmbH
Vishnu Vardhan Krishnamachari
G02 - OPTICS
Information
Patent Grant
Apparatus for mounting for multiple lasers
Patent number
8,517,319
Issue date
Aug 27, 2013
Leica Microsystems CMS GmbH
William C. Hay
G01 - MEASURING TESTING
Information
Patent Grant
Optical evaluation method by means of laser pulses and correspondin...
Patent number
8,253,937
Issue date
Aug 28, 2012
Leica Microsystems CMS GmbH
Vishnu Vardhan Krishnamachari
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for mounting multiple lasers, and microscope
Patent number
7,483,207
Issue date
Jan 27, 2009
Leica Microsystems CMS GmbH
Rafael Storz
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for determining a light power level, microscope, and meth...
Patent number
6,806,950
Issue date
Oct 19, 2004
Leica Microsystems Heidelberg GmbH
Heinrich Ulrich
G11 - INFORMATION STORAGE
Information
Patent Grant
Optical system in the ray path of a confocal fluorescence microscope
Patent number
6,785,302
Issue date
Aug 31, 2004
Leica Microsystems Heidelberg GmbH
Johann Engelhardt
G01 - MEASURING TESTING
Information
Patent Grant
Laser scanning microscope and shutter for an optical system
Patent number
6,710,337
Issue date
Mar 23, 2004
Leica Microsystems Heidelberg GmbH
Johann Engelhardt
G02 - OPTICS
Information
Patent Grant
Apparatus for selecting and detecting at least one spectral region...
Patent number
6,483,103
Issue date
Nov 19, 2002
Leica Microsystems Heidelberg GmbH
Johann Engelhardt
G01 - MEASURING TESTING
Information
Patent Grant
Laser scanning microscope
Patent number
6,392,794
Issue date
May 21, 2002
Leica Microsystems Heidelberg GmbH
Johann Engelhardt
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
RAMAN MICROSCOPIC IMAGING DEVICE
Publication number
20160363537
Publication date
Dec 15, 2016
Leica Microsystems CMS GmbH
Vishnu Vardhan KRISHNAMACHARI
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR ILLUMINATING A SAMPLE
Publication number
20160290928
Publication date
Oct 6, 2016
Leica Microsystems CMS GmbH
Vishnu Vardhan KRISHNAMACHARI
G01 - MEASURING TESTING
Information
Patent Application
TUNABLE MULTIPLE LASER PULSE SCANNING MICROSCOPE AND METHOD OF OPER...
Publication number
20110273768
Publication date
Nov 10, 2011
Leica Microsystems CMS GmbH
Vishnu Vardhan Krishnamachari
G02 - OPTICS
Information
Patent Application
OPTICAL EVALUATION METHOD BY MEANS OF LASER PULSES AND CORRESPONDIN...
Publication number
20100134793
Publication date
Jun 3, 2010
Leica Microsystems CMS GmbH
Vishnu Vardhan Krishnamachari
G01 - MEASURING TESTING
Information
Patent Application
Microscope
Publication number
20080193081
Publication date
Aug 14, 2008
Leica Microsystems CMS GmbH
William C. HAY
G02 - OPTICS
Information
Patent Application
APPARATUS FOR MOUNTING FOR MULTIPLE LASERS, AND MICROSCOPE
Publication number
20070154140
Publication date
Jul 5, 2007
Leica Microsystems CMS GmbH
Rafael Storz
G02 - OPTICS
Information
Patent Application
APPARATUS FOR MOUNTING FOR MULTIPLE LASERS
Publication number
20070146874
Publication date
Jun 28, 2007
Leica Microsystems CMS GmbH
William C. Hay
G02 - OPTICS
Information
Patent Application
Microscope system and method for shading correction of lenses prese...
Publication number
20070076232
Publication date
Apr 5, 2007
Leica Microsystems CMS GmbH
Frank Olschewski
G02 - OPTICS
Information
Patent Application
Microscope having apparatus for determining the light power level o...
Publication number
20030184857
Publication date
Oct 2, 2003
Leica Microsystems Heidelberg GmbH
William C. Hay
G02 - OPTICS
Information
Patent Application
Apparatus for determining a light power level, microscope, and meth...
Publication number
20020191177
Publication date
Dec 19, 2002
Leica Microsystems Heidelberg GmbH
Heinrich Ulrich
G02 - OPTICS
Information
Patent Application
Apparatus for selecting and detecting at least one spectral region...
Publication number
20020109079
Publication date
Aug 15, 2002
Leica Microsystems Heidelberg GmbH
Johann Engelhardt
G01 - MEASURING TESTING
Information
Patent Application
Safety apparatus for microscopes having a laser beam as illuminatio...
Publication number
20020097488
Publication date
Jul 25, 2002
Leica Microsystems Heidelberg GmbH
William C. Hay
G02 - OPTICS
Information
Patent Application
Laser scanning microscope and shutter for an optical system
Publication number
20020005483
Publication date
Jan 17, 2002
Leica Microsystems Heidelberg GmbH
Johann Engelhardt
G02 - OPTICS