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William C. Layer
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Boise, ID, US
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Patents Grants
last 30 patents
Information
Patent Grant
Automated multi-chip module handler and testing system
Patent number
6,750,666
Issue date
Jun 15, 2004
Micron Technology, Inc.
Mark A. Tverdy
G01 - MEASURING TESTING
Information
Patent Grant
Automated multi-chip module handler and testing system
Patent number
6,483,333
Issue date
Nov 19, 2002
Micron Technology, Inc.
Mark A. Tverdy
G01 - MEASURING TESTING
Information
Patent Grant
Magazine for carrying a plurality of multi-chip modules
Patent number
6,414,503
Issue date
Jul 2, 2002
Micron Technology, Inc.
Mark A. Tverdy
G01 - MEASURING TESTING
Information
Patent Grant
Automated multi-chip module handler, method of module handling, and...
Patent number
6,356,094
Issue date
Mar 12, 2002
Micron Technology, Inc.
Mark A. Tverdy
G01 - MEASURING TESTING
Information
Patent Grant
Automated multi-chip module handler, method of module handling, and...
Patent number
6,229,323
Issue date
May 8, 2001
Micron Technology, Inc.
Mark A. Tverdy
G01 - MEASURING TESTING
Information
Patent Grant
Tray for processing and/or shipping integrated circuit device
Patent number
5,927,503
Issue date
Jul 27, 1999
Micron Technology, Inc.
Leland R. Nevill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for processing and/or shipping integrated circuit devices
Patent number
5,731,230
Issue date
Mar 24, 1998
Micron Technology, Inc.
Leland R. Nevill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Burn-in board LIF unloader system and method
Patent number
5,267,395
Issue date
Dec 7, 1993
Micron Semiconductor, Inc.
Arthur T. Jones
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Integrated circuit marking and inspecting system
Patent number
5,226,361
Issue date
Jul 13, 1993
Micron Technology, Inc.
William R. Grant
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for automated handling of symmetrical supply tubes
Patent number
5,117,963
Issue date
Jun 2, 1992
Micron Technology, Inc.
Glenn S. Thayer
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Patents Applications
last 30 patents
Information
Patent Application
Automated multi-chip module handler and testing system
Publication number
20030006793
Publication date
Jan 9, 2003
Mark A. Tverdy
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED MULTI-CHIP MODULE HANDLER AND TESTING SYSTEM
Publication number
20020109517
Publication date
Aug 15, 2002
Mark A. Tverdy
G01 - MEASURING TESTING