William Clay Schluchter

Person

Loveland, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for cyclic error correction in a heterodyne int...
- Patent number 11,236,985
- Issue date Feb 1, 2022
- Keysight Technologies, Inc.
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measurement system and method of use
- Patent number 7,924,433
- Issue date Apr 12, 2011
- Agilent Technologies, Inc.
- William Clay Schluchter
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measurement sensor head and system having measurement...
- Patent number 7,561,280
- Issue date Jul 14, 2009
- Agilent Technologies, Inc.
- William Clay Schluchter
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measurement system
- Patent number 7,545,507
- Issue date Jun 9, 2009
- Agilent Technologies, Inc.
- William Clay Schluchter
- G01 - MEASURING TESTING
Information Patent Grant
System and method for interferometer non-linearity compensation
- Patent number 7,436,519
- Issue date Oct 14, 2008
- Agilent Technologies, Inc.
- David C. Chu
- G01 - MEASURING TESTING
Information Patent Grant
Low walk-off interferometer
- Patent number 7,362,447
- Issue date Apr 22, 2008
- Agilent Technologies, Inc.
- William Clay Schluchter
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for measuring perpendicular translations
- Patent number 7,355,719
- Issue date Apr 8, 2008
- Agilent Technologies, Inc.
- William Clay Schluchter
- G01 - MEASURING TESTING
Information Patent Grant
Low non-linear error displacement measuring interferometer
- Patent number 7,251,039
- Issue date Jul 31, 2007
- Agilent Technologies, Inc.
- William Clay Schluchter
- G01 - MEASURING TESTING
Information Patent Grant
System and method of using a side-mounted interferometer to acquire...
- Patent number 7,130,056
- Issue date Oct 31, 2006
- Agilent Technologies, Inc.
- William Clay Schluchter
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...
- Publication number 20210148691
- Publication date May 20, 2021
- KEYSIGHT TECHNOLOGIES, INC.
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...
- Publication number 20190113329
- Publication date Apr 18, 2019
- KEYSIGHT TECHNOLOGIES, INC.
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Application
DISPLACEMENT MEASUREMENT SYSTEM AND METHOD OF USE
- Publication number 20100060899
- Publication date Mar 11, 2010
- William Clay Schluchter
- G01 - MEASURING TESTING
Information Patent Application
DISPLACEMENT MEASUREMENT SENSOR HEAD AND SYSTEM HAVING MEASUREMENT...
- Publication number 20080304079
- Publication date Dec 11, 2008
- William Clay Schluchter
- G01 - MEASURING TESTING
Information Patent Application
Displacement Measurement System
- Publication number 20080225262
- Publication date Sep 18, 2008
- William Clay Schluchter
- G01 - MEASURING TESTING
Information Patent Application
LOW NON-LINEAR ERROR DISPLACEMENT MEASURING INTERFEROMETER
- Publication number 20070171426
- Publication date Jul 26, 2007
- AGILENT TECHNOLOGIES
- William Clay Schluchter
- G01 - MEASURING TESTING
Information Patent Application
Interferometer for measuring perpendicular translations
- Publication number 20070041022
- Publication date Feb 22, 2007
- William Clay Schluchter
- G01 - MEASURING TESTING
Information Patent Application
System and method for interferometer non-linearity compensation
- Publication number 20060274322
- Publication date Dec 7, 2006
- David C. Chu
- G01 - MEASURING TESTING
Information Patent Application
Lens correction element, system and method
- Publication number 20060245071
- Publication date Nov 2, 2006
- AGILENT TECHNOLOGIES
- David M. George
- G02 - OPTICS
Information Patent Application
System and method of using a side-mounted interferometer to acquire...
- Publication number 20050185193
- Publication date Aug 25, 2005
- William Clay Schluchter
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Using target images to determine a location of a stage
- Publication number 20050175217
- Publication date Aug 11, 2005
- Louis F. Mueller
- G06 - COMPUTING CALCULATING COUNTING

William Clay Schluchter

Person

Patents Grantslast 30 patents

Systems and methods for cyclic error correction in a heterodyne int...

Displacement measurement system and method of use

Displacement measurement sensor head and system having measurement...

Displacement measurement system

System and method for interferometer non-linearity compensation

Low walk-off interferometer

Interferometer for measuring perpendicular translations

Low non-linear error displacement measuring interferometer

System and method of using a side-mounted interferometer to acquire...

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...

SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...

DISPLACEMENT MEASUREMENT SYSTEM AND METHOD OF USE

DISPLACEMENT MEASUREMENT SENSOR HEAD AND SYSTEM HAVING MEASUREMENT...

Displacement Measurement System

LOW NON-LINEAR ERROR DISPLACEMENT MEASURING INTERFEROMETER

Interferometer for measuring perpendicular translations

System and method for interferometer non-linearity compensation

Lens correction element, system and method

System and method of using a side-mounted interferometer to acquire...

Using target images to determine a location of a stage