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William D. Darlington
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Austin, TX, US
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last 30 patents
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Patent Grant
Treatment for reduction of line edge roughness
Patent number
7,670,760
Issue date
Mar 2, 2010
FREESCALE SEMICONDUCTOR, INC.
Jinmiao James Shen
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
Method of making a semiconductor device using treated photoresist
Patent number
7,157,377
Issue date
Jan 2, 2007
FREESCALE SEMICONDUCTOR, INC.
Cesar M. Garza
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Treatment for reduction of line edge roughness
Publication number
20070207404
Publication date
Sep 6, 2007
Freescale Semiconductor, Inc.
Jinmiao James Shen
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method of making a semiconductor device using treated photoresist
Publication number
20050181630
Publication date
Aug 18, 2005
Cesar M. Garza
H01 - BASIC ELECTRIC ELEMENTS