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William D. Herzog
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Groton, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
All-to-all connected oscillator networks for solving combinatorial...
Patent number
11,698,945
Issue date
Jul 11, 2023
Massachusetts Institute of Technology
Jeffrey Chou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus for modulating light with phase change materials
Patent number
11,320,647
Issue date
May 3, 2022
Massachusetts Institute of Technology
Jeffrey Chou
G02 - OPTICS
Information
Patent Grant
Material property determination using photothermal speckle detection
Patent number
10,605,662
Issue date
Mar 31, 2020
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Grant
Devices and methods for sensing targets using photothermal speckle...
Patent number
10,228,284
Issue date
Mar 12, 2019
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Grant
Method and instrumentation for determining a physical property of a...
Patent number
9,594,011
Issue date
Mar 14, 2017
Massachusetts Institute of Technology
William D. Herzog
G01 - MEASURING TESTING
Information
Patent Grant
Spark-induced breakdown spectroscopy electrode assembly
Patent number
9,030,659
Issue date
May 12, 2015
Massachusetts Institute of Technology
Shane M. Tysk
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for in situ aerosol thermo-radiometric analysis
Patent number
8,274,655
Issue date
Sep 25, 2012
Massachusetts Institute of Technology
William D. Herzog
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for simultaneously measuring a three dimension...
Patent number
7,772,579
Issue date
Aug 10, 2010
Massachusetts Institute of Technology
William D. Herzog
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
All-to-All Connected Oscillator Networks for Solving Combinatorial...
Publication number
20220069771
Publication date
Mar 3, 2022
Jeffrey CHOU
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Material Property Determination Using Photothermal Speckle Detection
Publication number
20190250038
Publication date
Aug 15, 2019
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Application
Methods and Apparatus for Modulating Light with Phase Change Materials
Publication number
20190235228
Publication date
Aug 1, 2019
Jeffrey Chou
G02 - OPTICS
Information
Patent Application
DEVICES AND METHODS FOR SENSING TARGETS USING PHOTOTHERMAL SPECKLE...
Publication number
20170211977
Publication date
Jul 27, 2017
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Application
Spark-Induced Breakdown Spectroscopy Electrode Assembly
Publication number
20150029505
Publication date
Jan 29, 2015
Massachusetts Institute of Technology
Shane M. Tysk
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR IN SITU AEROSOL THERMO-RADIOMETRIC ANALYSIS
Publication number
20100220323
Publication date
Sep 2, 2010
Massachusetts Institute of Technology
William D. Herzog
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND INSTRUMENTATION FOR DETERMINING A PHYSICAL PROPERTY OF A...
Publication number
20090316138
Publication date
Dec 24, 2009
William D. Herzog
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for simultaneously measuring a three dimension...
Publication number
20080068605
Publication date
Mar 20, 2008
William D. Herzog
G01 - MEASURING TESTING