William D. McWhorter

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Goodyear, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
System, test chamber, and method for response time measurement of a...
- Patent number 10,571,354
- Issue date Feb 25, 2020
- NXP USA, INC.
- Philippe Garre
- G01 - MEASURING TESTING
Information Patent Grant
Controlled pulse generation methods and apparatuses for evaluating...
- Patent number 10,393,618
- Issue date Aug 27, 2019
- NXP USA, INC.
- Peter T. Jones
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Magnetic pre-conditioning of magnetic sensors
- Patent number 9,543,067
- Issue date Jan 10, 2017
- NXP USA, INC.
- Carlos M. Acuna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methodology and system for wafer-level testing of MEMS pressure sen...
- Patent number 9,527,731
- Issue date Dec 27, 2016
- NXP USA, INC.
- Bruno J. Debeurre
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Methods and apparatus for calibrating transducer-including devices
- Patent number 9,400,226
- Issue date Jul 26, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Raimondo P. Sessego
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM, TEST CHAMBER, AND METHOD FOR RESPONSE TIME MEASUREMENT OF A...
- Publication number 20180058970
- Publication date Mar 1, 2018
- FREESCALE SEMICONDUCTOR, INC.
- Philippe Garre
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLED PULSE GENERATION METHODS AND APPARATUSES FOR EVALUATING...
- Publication number 20170370799
- Publication date Dec 28, 2017
- Freescale Semiconductor Inc.
- PETER T. JONES
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SENSORS
- Publication number 20160116361
- Publication date Apr 28, 2016
- FREESCALE SEMICONDUCTOR, INC.
- BRUNO J. DEBEURRE
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHODOLOGY AND SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SEN...
- Publication number 20160107887
- Publication date Apr 21, 2016
- FREESCALE SEMICONDUCTOR, INC.
- BRUNO J. DEBEURRE
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MAGNETIC PRE-CONDITIONING OF MAGNETIC SENSORS
- Publication number 20150179325
- Publication date Jun 25, 2015
- CARLOS M. ACUNA
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR CALIBRATING TRANSDUCER-INCLUDING DEVICES
- Publication number 20140303926
- Publication date Oct 9, 2014
- Raimondo P. Sessego
- G01 - MEASURING TESTING