William Drohan

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Bedford, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer shape accuracy using symmetric and asymmetric instrument erro...
- Patent number 6,594,002
- Issue date Jul 15, 2003
- ADE Corporation
- William Drohan
- G01 - MEASURING TESTING
Information Patent Grant
Testing system with real time/off line functionality allocation
- Patent number 5,750,908
- Issue date May 12, 1998
- ADE Corproation
- William Drohan
- G01 - MEASURING TESTING
Information Patent Grant
Airborne surveying apparatus and method
- Patent number 4,168,524
- Issue date Sep 18, 1979
- The Charles Stark Draper Laboratory, Inc.
- J. Arnold Soltz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Shape accuracy improvement using a novel calibration approach
- Publication number 20020017911
- Publication date Feb 14, 2002
- William Drohan
- G01 - MEASURING TESTING