William E. Burchanowski

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Bethlehem, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Circuit and method for predicting failure rates in a semiconductor...
- Patent number 5,986,281
- Issue date Nov 16, 1999
- Lucent Technologies, Inc.
- William Edward Burchanowski
- G01 - MEASURING TESTING
Information Patent Grant
Fast testing of D/A converters
- Patent number 5,841,382
- Issue date Nov 24, 1998
- Lucent Technologies Inc.
- Robert W. Walden
- H03 - BASIC ELECTRONIC CIRCUITRY