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William E. Ott

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  • Phoenix, AZ, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Integrated multi-mode sensor
    • Patent number 7,501,968
    • Issue date Mar 10, 2009
    • Honeywell International, Inc.
    • Paul B. DuPuis
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Cell buffer with built-in test
    • Patent number 6,777,946
    • Issue date Aug 17, 2004
    • Honeywell International Inc.
    • William E. Ott
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Hold-up power supply for flash memory
    • Patent number 6,735,117
    • Issue date May 11, 2004
    • Honeywell International Inc.
    • William E. Ott
    • G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

  • Information Patent Application

    Integrated multi-mode sensor
    • Publication number 20080143569
    • Publication date Jun 19, 2008
    • Honeywell International, Inc.
    • Paul B. DuPuis
    • G01 - MEASURING TESTING
  • Information Patent Application

    CELL BUFFER WITH BUILT-IN TEST
    • Publication number 20040088629
    • Publication date May 6, 2004
    • William E. Ott
    • G01 - MEASURING TESTING
  • Information Patent Application

    Hold-up power supply for flash memory
    • Publication number 20040001359
    • Publication date Jan 1, 2004
    • William E. Ott
    • G11 - INFORMATION STORAGE