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William F. Herrington
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Cambridge, MA, US
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Patents Grants
last 30 patents
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Patent Grant
Swept-source Raman spectroscopy systems and methods
Patent number
11,307,092
Issue date
Apr 19, 2022
Massachusetts Institute of Technology
Amir H. Atabaki
G02 - OPTICS
Information
Patent Grant
Apparatus, systems, and methods for talbot spectrometers
Patent number
10,732,044
Issue date
Aug 4, 2020
Massachusetts Institute of Technology
Erika Ye
G01 - MEASURING TESTING
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Patent Grant
Swept-source Raman spectroscopy systems and methods
Patent number
10,656,012
Issue date
May 19, 2020
Massachusetts Institute of Technology
Amir H. Atabaki
G02 - OPTICS
Information
Patent Grant
Apparatus, systems, and methods for Talbot spectrometers
Patent number
10,533,895
Issue date
Jan 14, 2020
Massachusetts Institute of Technology
Erika Ye
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, systems, and methods for Talbot spectrometers
Patent number
10,215,639
Issue date
Feb 26, 2019
Massachusetts Institute of Technology
Erika Ye
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SWEPT-SOURCE RAMAN SPECTROSCOPY SYSTEMS AND METHODS
Publication number
20210116298
Publication date
Apr 22, 2021
Massachusetts Institute of Technology
Amir H. Atabaki
G02 - OPTICS
Information
Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR TALBOT SPECTROMETERS
Publication number
20200103281
Publication date
Apr 2, 2020
Massachusetts Institute of Technology
Erika Ye
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR TALBOT SPECTROMETERS
Publication number
20190323892
Publication date
Oct 24, 2019
Massachusetts Institute of Technology
Erika Ye
G01 - MEASURING TESTING
Information
Patent Application
Swept-Source Raman Spectroscopy Systems and Methods
Publication number
20190195688
Publication date
Jun 27, 2019
Amir H. Atabaki
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR TALBOT SPECTROMETERS
Publication number
20170059412
Publication date
Mar 2, 2017
Erika YE
G01 - MEASURING TESTING