Membership
Tour
Register
Log in
William F. Hug
Follow
Person
Pasadena, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Methods and systems for detection of biohazard signatures in comple...
Patent number
11,448,598
Issue date
Sep 20, 2022
Photon Systems, Inc.
Rohit Bhartia
G01 - MEASURING TESTING
Information
Patent Grant
Native fluorescence detection methods, devices, and systems for org...
Patent number
11,262,301
Issue date
Mar 1, 2022
Photon Systems, Inc.
William F. Hug
G01 - MEASURING TESTING
Information
Patent Grant
Native fluorescence detection methods, devices, and systems for org...
Patent number
10,895,533
Issue date
Jan 19, 2021
Photon Systems, Inc.
William F. Hug
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic chemical analysis methods and apparatus
Patent number
10,890,533
Issue date
Jan 12, 2021
Photon Systems, Inc.
William F. Hug
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic chemical analysis methods and apparatus
Patent number
10,753,863
Issue date
Aug 25, 2020
Photon Systems, Inc.
William F. Hug
G01 - MEASURING TESTING
Information
Patent Grant
Native fluorescence detection methods, devices, and systems for org...
Patent number
10,598,596
Issue date
Mar 24, 2020
Photon Systems, Inc.
William F. Hug
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic chemical analysis methods and apparatus
Patent number
9,915,603
Issue date
Mar 13, 2018
Photon Systems, Inc.
William F. Hug
G01 - MEASURING TESTING
Information
Patent Grant
Native fluorescence detection methods, devices, and systems for org...
Patent number
9,909,990
Issue date
Mar 6, 2018
Photon Systems, Inc.
William F. Hug
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic chemical analysis methods and apparatus
Patent number
9,568,418
Issue date
Feb 14, 2017
Photon Systems, Inc.
William F. Hug
G01 - MEASURING TESTING
Information
Patent Grant
Native fluorescence detection methods, devices, and systems for org...
Patent number
9,442,070
Issue date
Sep 13, 2016
Photon Systems, Inc.
William F. Hug
G01 - MEASURING TESTING
Information
Patent Grant
Native fluorescence detection methods and detectors for naphthalene...
Patent number
8,759,791
Issue date
Jun 24, 2014
Photon Systems, Inc.
William F. Hug
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic chemical analysis methods and apparatus
Patent number
8,395,770
Issue date
Mar 12, 2013
Photon Systems
William F. Hug
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic chemical analysis methods and apparatus
Patent number
7,800,753
Issue date
Sep 21, 2010
Photon Systems
William F. Hug
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam pumped semiconductor laser
Patent number
7,590,161
Issue date
Sep 15, 2009
Photon Systems
William F. Hug
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic chemical analysis methods and apparatus
Patent number
7,525,653
Issue date
Apr 28, 2009
Photon Systems
William F. Hug
G01 - MEASURING TESTING
Information
Patent Grant
Sputtering metal ion laser
Patent number
6,693,944
Issue date
Feb 17, 2004
William F. Hug
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Extended lifetime frequency conversion crystals
Patent number
6,532,100
Issue date
Mar 11, 2003
3D Systems, Inc.
Jouni P. Partanen
G02 - OPTICS
Information
Patent Grant
Method for operating a laser light source
Patent number
6,418,153
Issue date
Jul 9, 2002
Leica Microsystems Heidelberg GmbH
Johann Engelhardt
G02 - OPTICS
Information
Patent Grant
Laser with absorption optimized pumping of a gain medium
Patent number
6,347,101
Issue date
Feb 12, 2002
3D Systems, Inc.
Xingkun Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Analytical instrument using a sputtering metal ion laser
Patent number
6,287,869
Issue date
Sep 11, 2001
William F. Hug
G01 - MEASURING TESTING
Information
Patent Grant
Xenon ceramic lamp with integrated compound reflectors
Patent number
6,200,005
Issue date
Mar 13, 2001
ILC Technology, Inc.
Roy D. Roberts
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for forming three-dimensional objects in stere...
Patent number
6,172,996
Issue date
Jan 9, 2001
3D Systems, Inc.
Jouni P. Partanen
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Laser with optimized coupling of pump light to a gain medium in a s...
Patent number
6,157,663
Issue date
Dec 5, 2000
3D Systems, Inc.
Xingkun Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for forming three-dimensional objects in stere...
Patent number
5,840,239
Issue date
Nov 24, 1998
3D Systems, Inc.
Jouni P. Partanen
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
System for rapidly producing either integrated circuits on a substr...
Patent number
5,558,884
Issue date
Sep 24, 1996
Omnichrome Corporation
William F. Hug
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Liquid stabilized internal mirror lasers
Patent number
5,311,529
Issue date
May 10, 1994
Omnichrome Corporation
William F. Hug
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection/detection system with a laser module for use in forensic...
Patent number
5,072,338
Issue date
Dec 10, 1991
William F. Hug
G02 - OPTICS
Information
Patent Grant
System for rapidly producing plastic parts
Patent number
5,026,146
Issue date
Jun 25, 1991
William F. Hug
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Ultraviolet metal vapor laser having hard sealed internal mirrors
Patent number
5,012,479
Issue date
Apr 30, 1991
William F. Hug
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Metal vapor laser having means to extend lifetime of tube
Patent number
4,956,845
Issue date
Sep 11, 1990
Manfred R. Otto
H01 - BASIC ELECTRIC ELEMENTS