William H. Baylis

Person

Tiburon, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Laser-based alignment tool
- Patent number 7,497,018
- Issue date Mar 3, 2009
- William Hersey
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for breaking semiconductor wafers
- Patent number 7,262,115
- Issue date Aug 28, 2007
- Dynatex International
- William H. Baylis
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Grant
Nonintrusive inspection system
- Patent number 7,050,536
- Issue date May 23, 2006
- InVision Technologies, Inc.
- Gerhard Fenkart
- G01 - MEASURING TESTING
Information Patent Grant
Nonintrusive inspection apparatus
- Patent number 6,957,913
- Issue date Oct 25, 2005
- InVision Technologies, Inc.
- Gerhard Renkart
- G01 - MEASURING TESTING
Information Patent Grant
Nonintrusive inspection apparatus
- Patent number 6,707,875
- Issue date Mar 16, 2004
- InVision Technologies, Inc.
- Gerhard Fenkart
- G01 - MEASURING TESTING
Information Patent Grant
Nonintrusive inspection apparatus
- Patent number 6,647,091
- Issue date Nov 11, 2003
- InVision Technologies, Inc.
- Gerhard Fenkart
- G01 - MEASURING TESTING
Information Patent Grant
Nonintrusive inspection system
- Patent number 6,590,956
- Issue date Jul 8, 2003
- InVision Technologies, Inc.
- Gerhard Fenkart
- G01 - MEASURING TESTING
Information Patent Grant
Nonintrusive inspection system
- Patent number 6,430,255
- Issue date Aug 6, 2002
- InVision Technologies, Inc.
- Gerhard Fenkart
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Laser-based alignment tool
- Publication number 20070271800
- Publication date Nov 29, 2007
- William Hersey
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for breaking semiconductor wafers
- Publication number 20070048972
- Publication date Mar 1, 2007
- DYNATEX INTERNATIONAL
- William H. Baylis
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Application
Nonintrusive inspection apparatus
- Publication number 20020097835
- Publication date Jul 25, 2002
- Gerhard Fenkart
- G01 - MEASURING TESTING
Information Patent Application
Nonintrusive inspection system
- Publication number 20020071524
- Publication date Jun 13, 2002
- Gerhard Renkart
- G01 - MEASURING TESTING
Information Patent Application
Nonintrusive inspection apparatus
- Publication number 20020071516
- Publication date Jun 13, 2002
- Gerhard Fenkart
- G01 - MEASURING TESTING
Information Patent Application
Nonintrusive inspection apparatus
- Publication number 20020071522
- Publication date Jun 13, 2002
- Gerhard Fenkart
- G01 - MEASURING TESTING
Information Patent Application
Nonintrusive inspection system
- Publication number 20020071525
- Publication date Jun 13, 2002
- Gerhard Fenkart
- G01 - MEASURING TESTING
Information Patent Application
Nonintrusive inspection system
- Publication number 20020018542
- Publication date Feb 14, 2002
- Gerhard Fenkart
- G01 - MEASURING TESTING

William H. Baylis

Person

Patents Grantslast 30 patents

Laser-based alignment tool

Method and apparatus for breaking semiconductor wafers

Nonintrusive inspection system

Nonintrusive inspection apparatus

Nonintrusive inspection apparatus

Nonintrusive inspection apparatus

Nonintrusive inspection system

Nonintrusive inspection system

Patents Applicationslast 30 patents

Laser-based alignment tool

Method and apparatus for breaking semiconductor wafers

Nonintrusive inspection apparatus

Nonintrusive inspection system

Nonintrusive inspection apparatus

Nonintrusive inspection apparatus

Nonintrusive inspection system

Nonintrusive inspection system