William H. Brearley

Person

Poughkeepsie, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical rule checking for detecting at risk structures for overlay...
- Patent number 11,182,531
- Issue date Nov 23, 2021
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical rule checking for detecting at risk structures for overlay...
- Patent number 11,163,934
- Issue date Nov 2, 2021
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical rule checking for detecting at risk structures for overlay...
- Patent number 10,395,002
- Issue date Aug 27, 2019
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical rule checking for detecting at risk structures for overlay...
- Patent number 10,339,261
- Issue date Jul 2, 2019
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical rule checking for detecting at risk structures for overlay...
- Patent number 9,607,268
- Issue date Mar 28, 2017
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical rule checking for detecting at risk structures for overlay...
- Patent number 9,330,223
- Issue date May 3, 2016
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Block mask decomposition for mitigating corner rounding
- Patent number 8,584,060
- Issue date Nov 12, 2013
- International Business Machines Corporation
- William Brearley
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Dry etchback of interconnect contacts
- Patent number 7,645,700
- Issue date Jan 12, 2010
- International Business Machines Corporation
- Theodorus E. Standaert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dry etchback of interconnect contacts
- Patent number 7,323,410
- Issue date Jan 29, 2008
- International Business Machines Corporation
- Theodorus E. Standaert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reactive Ion Etching chamber design for flip chip interconnections
- Patent number 6,531,069
- Issue date Mar 11, 2003
- International Business Machines Corporation
- Kamalesh K. Srivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for use in manufacturing semiconductor devices
- Patent number 6,448,169
- Issue date Sep 10, 2002
- International Business Machines Corporation
- William Brearley
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Integrated method for etching of BLM titanium-tungsten alloys for C...
- Patent number 6,293,457
- Issue date Sep 25, 2001
- International Business Machines Corporation
- Kamalesh K. Srivastava
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and method for use in manufacturing semiconductor devices
- Patent number 6,149,048
- Issue date Nov 21, 2000
- International Business Machines Corporation
- William Brearley
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus for providing solder interconnections to semiconductor an...
- Patent number 6,099,935
- Issue date Aug 8, 2000
- International Business Machines Corporation
- William Brearley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ball grid array by partitioned lamination process
- Patent number 5,735,452
- Issue date Apr 7, 1998
- International Business Machines Corporation
- Roy Yu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Bottom-surface-metallurgy rework process in ceramic modules
- Patent number 5,722,579
- Issue date Mar 3, 1998
- International Business Machines Corporation
- Roy Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion milling end point detection method and apparatus
- Patent number 5,690,784
- Issue date Nov 25, 1997
- International Business Machines Corporation
- William Harrington Brearley
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...
- Publication number 20190340329
- Publication date Nov 7, 2019
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...
- Publication number 20190258774
- Publication date Aug 22, 2019
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...
- Publication number 20170116368
- Publication date Apr 27, 2017
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...
- Publication number 20160196502
- Publication date Jul 7, 2016
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...
- Publication number 20160092783
- Publication date Mar 31, 2016
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...
- Publication number 20140095124
- Publication date Apr 3, 2014
- International Business Machines Corporation
- Shayak Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DRY ETCHBACK OF INTERCONNECT CONTACTS
- Publication number 20080088027
- Publication date Apr 17, 2008
- International Business Machines Corporation
- Theodorus E. Standaert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRY ETCHBACK OF INTERCONNECT CONTACTS
- Publication number 20070032055
- Publication date Feb 8, 2007
- International Business Machines Corporation
- Theodorus E. Standaert
- H01 - BASIC ELECTRIC ELEMENTS

William H. Brearley

Person

Patents Grantslast 30 patents

Optical rule checking for detecting at risk structures for overlay...

Optical rule checking for detecting at risk structures for overlay...

Optical rule checking for detecting at risk structures for overlay...

Optical rule checking for detecting at risk structures for overlay...

Optical rule checking for detecting at risk structures for overlay...

Optical rule checking for detecting at risk structures for overlay...

Block mask decomposition for mitigating corner rounding

Dry etchback of interconnect contacts

Dry etchback of interconnect contacts

Reactive Ion Etching chamber design for flip chip interconnections

Apparatus and method for use in manufacturing semiconductor devices

Integrated method for etching of BLM titanium-tungsten alloys for C...

Apparatus and method for use in manufacturing semiconductor devices

Apparatus for providing solder interconnections to semiconductor an...

Ball grid array by partitioned lamination process

Bottom-surface-metallurgy rework process in ceramic modules

Ion milling end point detection method and apparatus

Patents Applicationslast 30 patents

OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...

OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...

OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...

OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...

OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...

OPTICAL RULE CHECKING FOR DETECTING AT RISK STRUCTURES FOR OVERLAY...

DRY ETCHBACK OF INTERCONNECT CONTACTS

DRY ETCHBACK OF INTERCONNECT CONTACTS