William H. Howland, Jr.

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Wexford, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of detecting un-annealed ion implants
- Patent number 7,250,313
- Issue date Jul 31, 2007
- Solid State Measurements, Inc.
- William H. Howland, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor substrate surface preparation using high temperature...
- Patent number 7,063,992
- Issue date Jun 20, 2006
- Solid State Measurements, Inc.
- Michael J. Adams
- H01 - BASIC ELECTRIC ELEMENTS