William H. Howland

Person

Wexford, PA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wear test apparatus
- Patent number 10,241,018
- Issue date Mar 26, 2019
- U.S. Department of Energy
- Paolo R. Zafred
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring semiconductor wafer electrical p...
- Patent number 6,972,582
- Issue date Dec 6, 2005
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining electrical properties of a sem...
- Patent number 6,894,519
- Issue date May 17, 2005
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Grant
Non-invasive electrical measurement of semiconductor wafers
- Patent number 6,842,029
- Issue date Jan 11, 2005
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining defect and impurity concentrat...
- Patent number 6,836,139
- Issue date Dec 28, 2004
- Solid State Measurments, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Grant
Sample chuck with compound construction
- Patent number 6,803,780
- Issue date Oct 12, 2004
- Solid State Measurements, Inc.
- Michael John Adams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for determining doping concentration of a semiconductor w...
- Patent number 6,788,076
- Issue date Sep 7, 2004
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining one or more properties of a semiconductor wafer
- Patent number 6,741,093
- Issue date May 25, 2004
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Grant
High speed threshold voltage and average surface doping measurements
- Patent number 6,657,454
- Issue date Dec 2, 2003
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining doping concentration of a semi...
- Patent number 6,632,691
- Issue date Oct 14, 2003
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR NON-INVASIVE, NON-INTRUSIVE, AND UN-GROUND...
- Publication number 20240085470
- Publication date Mar 14, 2024
- FemtoMetrix, Inc.
- Timothy M. Wong
- G01 - MEASURING TESTING
Information Patent Application
Wear Test Apparatus
- Publication number 20170153171
- Publication date Jun 1, 2017
- UNITED STATES DEPARTMENT OF ENERGY
- Paolo R. Zafred
- G01 - MEASURING TESTING
Information Patent Application
NONCONTACT SENSING OF MAXIMUM OPEN-CIRCUIT VOLTAGES
- Publication number 20160313388
- Publication date Oct 27, 2016
- LEHIGHTON ELECTRONICS, INC.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring semiconductor wafers with an oxide enhanced probe
- Publication number 20060219658
- Publication date Oct 5, 2006
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
In-situ wafer and probe desorption using closed loop heating
- Publication number 20060097740
- Publication date May 11, 2006
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for determining concentration of defects and/o...
- Publication number 20060066323
- Publication date Mar 30, 2006
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Method of detecting un-annealed ion implants
- Publication number 20060068514
- Publication date Mar 30, 2006
- Solid State Measurements, Inc.
- William H. Howland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR DETECTING SOFT BREAKDOWN OF A DIELECTRIC L...
- Publication number 20050287684
- Publication date Dec 29, 2005
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Work function controlled probe for measuring properties of a semico...
- Publication number 20050253618
- Publication date Nov 17, 2005
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for removing and/or preventing surface contami...
- Publication number 20050241175
- Publication date Nov 3, 2005
- Solid State Measurements, Inc.
- William H. Howland
- B08 - CLEANING
Information Patent Application
Method and apparatus for determining the dielectric constant of a l...
- Publication number 20050146348
- Publication date Jul 7, 2005
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor substrate surface preparation using high temperature...
- Publication number 20050028836
- Publication date Feb 10, 2005
- Solid State Measurements, Inc.
- Michael J. Adams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for measuring semiconductor wafer electrical p...
- Publication number 20040155240
- Publication date Aug 12, 2004
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Method of detecting carrier dose of a semiconductor wafer
- Publication number 20040108869
- Publication date Jun 10, 2004
- William H Howland
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for determining defect and impurity concentrat...
- Publication number 20040075460
- Publication date Apr 22, 2004
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for determining doping concentration of a semiconductor w...
- Publication number 20040008033
- Publication date Jan 15, 2004
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Non-invasive electrical measurement of semiconductor wafers
- Publication number 20030227292
- Publication date Dec 11, 2003
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for determining electrical properties of a sem...
- Publication number 20030210066
- Publication date Nov 13, 2003
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
High speed threshold voltage and average surface doping measurements
- Publication number 20030173988
- Publication date Sep 18, 2003
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Sample chuck with compound construction
- Publication number 20030011392
- Publication date Jan 16, 2003
- Solid State Measurements, Inc.
- Michael John Adams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of detecting carrier dose of a semiconductor wafer
- Publication number 20020180474
- Publication date Dec 5, 2002
- Soild State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING

William H. Howland

Person

Patents Grantslast 30 patents

Wear test apparatus

Apparatus and method for measuring semiconductor wafer electrical p...

Apparatus and method for determining electrical properties of a sem...

Non-invasive electrical measurement of semiconductor wafers

Method and apparatus for determining defect and impurity concentrat...

Sample chuck with compound construction

Apparatus for determining doping concentration of a semiconductor w...

Method of determining one or more properties of a semiconductor wafer

High speed threshold voltage and average surface doping measurements

Apparatus and method for determining doping concentration of a semi...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR NON-INVASIVE, NON-INTRUSIVE, AND UN-GROUND...

Wear Test Apparatus

NONCONTACT SENSING OF MAXIMUM OPEN-CIRCUIT VOLTAGES

Method of measuring semiconductor wafers with an oxide enhanced probe

In-situ wafer and probe desorption using closed loop heating

Method and apparatus for determining concentration of defects and/o...

Method of detecting un-annealed ion implants

APPARATUS AND METHOD FOR DETECTING SOFT BREAKDOWN OF A DIELECTRIC L...

Work function controlled probe for measuring properties of a semico...

Method and apparatus for removing and/or preventing surface contami...

Method and apparatus for determining the dielectric constant of a l...

Semiconductor substrate surface preparation using high temperature...

Apparatus and method for measuring semiconductor wafer electrical p...

Method of detecting carrier dose of a semiconductor wafer

Method and apparatus for determining defect and impurity concentrat...

Apparatus for determining doping concentration of a semiconductor w...

Non-invasive electrical measurement of semiconductor wafers

Apparatus and method for determining electrical properties of a sem...

High speed threshold voltage and average surface doping measurements

Sample chuck with compound construction

Method of detecting carrier dose of a semiconductor wafer