William H. McAnney

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LaGrangeville, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Clocking mechanism for delay, short path and stuck-at testing
- Patent number 5,617,426
- Issue date Apr 1, 1997
- International Business Machines Corporation
- Bernd K. F. Koenemann
- G01 - MEASURING TESTING
Information Patent Grant
Reduced delay circuits for shift register latch scan strings
- Patent number 5,150,366
- Issue date Sep 22, 1992
- International Business Machines Corp.
- Paul H. Bardell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simultaneous self-testing system
- Patent number 4,513,418
- Issue date Apr 23, 1985
- International Business Machines Corporation
- Paul H. Bardell
- G01 - MEASURING TESTING
Information Patent Grant
Parallel path self-testing system
- Patent number 4,503,537
- Issue date Mar 5, 1985
- International Business Machines Corporation
- William H. McAnney
- G01 - MEASURING TESTING