William J. Baukus

Follow

Person

Nashua, NH, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods to perform backscatter inspection of complex targets in con...
- Patent number 8,923,481
- Issue date Dec 30, 2014
- American Science and Engineering, Inc.
- Jeffrey R. Schubert
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection based on scatter detection
- Patent number 7,551,715
- Issue date Jun 23, 2009
- American Science and Engineering, Inc.
- Peter Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
X-ray backscatter detection imaging modules
- Patent number 7,505,556
- Issue date Mar 17, 2009
- American Science and Engineering, Inc.
- Alex Chalmers
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods to Perform Backscatter Inspection of Complex Targets in Con...
- Publication number 20130101090
- Publication date Apr 25, 2013
- American Science and Engineering, Inc.
- Jeffrey R. Schubert
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Inspection Trailer
- Publication number 20090257555
- Publication date Oct 15, 2009
- American Science and Engineering, Inc.
- Alex Chalmers
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Backscatter Detection Imaging Modules
- Publication number 20070269005
- Publication date Nov 22, 2007
- Alex Chalmers
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Inspection Based on Scatter Detection
- Publication number 20070098142
- Publication date May 3, 2007
- Peter Rothschild
- G01 - MEASURING TESTING