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William J. Fies
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Portola Valley, CA, US
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last 30 patents
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Patent Grant
Ion source assembly for an ion trap mass spectrometer and method
Patent number
5,756,996
Issue date
May 26, 1998
Finnigan Corporation
Mark E. Bier
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Quadrupole mass filter with unbalanced R.F. voltage
Patent number
4,816,675
Issue date
Mar 28, 1989
Finnigan Corporation
William J. Fies
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fourtier transform quadrupole mass spectrometer and method
Patent number
4,755,670
Issue date
Jul 5, 1988
Finnigan Corporation
John E. P. Syka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of mass analyzing a sample over a wide mass range by use of...
Patent number
4,650,999
Issue date
Mar 17, 1987
Finnigan Corporation
William J. Fies
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer system and method for control of ion energy for d...
Patent number
4,214,160
Issue date
Jul 22, 1980
Finnigan Corporation
William J. Fies
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Temperature stable multipole mass filter and method therefor
Patent number
4,032,782
Issue date
Jun 28, 1977
Finnigan Corporation
Ronald D. Smith
H01 - BASIC ELECTRIC ELEMENTS