William J. Parrish

Person

Santa Barbara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Design, test, and operation of a small thermal imaging core
- Patent number 12,104,962
- Issue date Oct 1, 2024
- SEEK THERMAL, INC.
- William J. Parrish
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Cost effective, mass producible temperature controlled thermal imag...
- Patent number 12,055,446
- Issue date Aug 6, 2024
- SEEK THERMAL, INC.
- William J. Parrish
- G01 - MEASURING TESTING
Information Patent Grant
Design, test, and operation of a small thermal imaging core
- Patent number 11,892,356
- Issue date Feb 6, 2024
- SEEK THERMAL, INC.
- William J. Parrish
- G01 - MEASURING TESTING
Information Patent Grant
Design, test, and operation of a small thermal imaging core
- Patent number 11,774,293
- Issue date Oct 3, 2023
- SEEK THERMAL, INC.
- William J. Parrish
- G01 - MEASURING TESTING
Information Patent Grant
Cost effective, mass producible system for rapid detection of fever...
- Patent number 11,625,828
- Issue date Apr 11, 2023
- SEEK THERMAL, INC.
- William J. Parrish
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Design, test, and operation of a small thermal imaging core
- Patent number 11,353,365
- Issue date Jun 7, 2022
- SEEK THERMAL, INC.
- William J. Parrish
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wafer level processed microbolometer focal plane array
- Patent number 10,976,202
- Issue date Apr 13, 2021
- SEEK THERMAL, INC.
- William J. Parrish
- G01 - MEASURING TESTING
Information Patent Grant
Thermography process for converting signal to temperature in a ther...
- Patent number 10,890,490
- Issue date Jan 12, 2021
- SEEK THERMAL, INC.
- Ross E. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Fixed pattern noise mitigation for a thermal imaging system
- Patent number 10,867,371
- Issue date Dec 15, 2020
- SEEK THERMAL, INC.
- Ross Williams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermography process for converting signal to temperature in a ther...
- Patent number 10,605,668
- Issue date Mar 31, 2020
- SEEK THERMAL, INC.
- Ross E. Williams
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image adjustment based on locally flat scenes
- Patent number 10,600,164
- Issue date Mar 24, 2020
- SEEK THERMAL, INC.
- Jeffrey Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image adjustment based on locally flat scenes
- Patent number 10,467,736
- Issue date Nov 5, 2019
- SEEK THERMAL, INC.
- Jeffrey Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of producing an optical element
- Patent number 10,437,024
- Issue date Oct 8, 2019
- SEEK THERMAL, INC.
- Scott Dayton
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Combination flashlight and camera
- Patent number D846781
- Issue date Apr 23, 2019
- SEEK THERMAL, INC.
- Jeffrey Lee
- D26 - Lighting
Information Patent Grant
Fixed pattern noise mitigation for a thermal imaging system
- Patent number 10,230,912
- Issue date Mar 12, 2019
- SEEK THERMAL, INC.
- Ross Williams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Local contrast adjustment for digital images
- Patent number 10,186,020
- Issue date Jan 22, 2019
- SEEK THERMAL, INC.
- Andreas Engberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Gain calibration for an imaging system
- Patent number 10,128,808
- Issue date Nov 13, 2018
- Seek Thermal, Inc.
- Jason Wolfe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data digitization and display for an imaging system
- Patent number 10,075,658
- Issue date Sep 11, 2018
- Seek Thermal, Inc.
- William J. Parrish
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image adjustment based on locally flat scenes
- Patent number 9,947,086
- Issue date Apr 17, 2018
- Seek Thermal, Inc.
- Jeffrey Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Time based offset correction for imaging systems
- Patent number 9,930,324
- Issue date Mar 27, 2018
- Seek Thermal, Inc.
- Romeo Chahine
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Time based offset correction for imaging systems and adaptive calib...
- Patent number 9,924,116
- Issue date Mar 20, 2018
- Seek Thermal, Inc.
- Romeo Chahine
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Shutter for an infrared camera
- Patent number 9,798,220
- Issue date Oct 24, 2017
- Seek Thermal, Inc.
- Blake Henry
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Radiometric test and configuration of an infrared focal plane array...
- Patent number 9,797,942
- Issue date Oct 24, 2017
- Seek Thermal, Inc.
- Andreas Engberg
- G01 - MEASURING TESTING
Information Patent Grant
Local contrast adjustment for digital images
- Patent number 9,727,954
- Issue date Aug 8, 2017
- Seek Thermal, Inc.
- Andreas Engberg
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Gain calibration for an imaging system
- Patent number 9,595,934
- Issue date Mar 14, 2017
- Seek Thermal, Inc.
- Jason Wolfe
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Infrared camera packaging
- Patent number 7,752,742
- Issue date Jul 13, 2010
- FLIR Systems, Inc.
- Paul Schweikert
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Bolometer array compensation
- Patent number 7,709,793
- Issue date May 4, 2010
- William J. Parrish
- G01 - MEASURING TESTING
Information Patent Grant
Infrared camera packaging
- Patent number 7,470,904
- Issue date Dec 30, 2008
- FLIR Systems, Inc.
- Paul Schweikert
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Infrared camera electronic architectures
- Patent number 7,470,902
- Issue date Dec 30, 2008
- FLIR Systems, Inc.
- Douglas R. Kraemer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Microbolometer focal plane array systems and methods
- Patent number 7,034,301
- Issue date Apr 25, 2006
- Indigo Systems Corporation
- William J. Parrish
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
THERMAL IMAGING CAMERA MODULE CONFIGURED FOR INTEGRATION INTO A HOS...
- Publication number 20240397216
- Publication date Nov 28, 2024
- Seek Thermal, Inc.
- Leonard Araki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
COST EFFECTIVE, MASS PRODUCIBLE TEMPERATURE CONTROLLED THERMAL IMAG...
- Publication number 20240361191
- Publication date Oct 31, 2024
- Seek Thermal, Inc.
- William J. Parrish
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
DESIGN, TEST, AND OPERATION OF A SMALL THERMAL IMAGING CORE
- Publication number 20240240988
- Publication date Jul 18, 2024
- Seek Thermal, Inc.
- William J. Parrish
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
NOISE REDUCTION AND FEATURE ENHANCEMENT FOR A THERMAL IMAGING CAMERA
- Publication number 20230410263
- Publication date Dec 21, 2023
- Seek Thermal, Inc.
- Daniel Bode
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NOISE REDUCTION AND FEATURE ENHANCEMENT FOR A THERMAL IMAGING CAMERA
- Publication number 20230410262
- Publication date Dec 21, 2023
- Seek Thermal, Inc.
- Daniel Bode
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THERMAL IMAGING CAMERA MODULE CONFIGURED FOR INTEGRATION INTO A HOS...
- Publication number 20230366740
- Publication date Nov 16, 2023
- Seek Thermal, Inc.
- Leonard Araki
- G01 - MEASURING TESTING
Information Patent Application
COST EFFECTIVE, MASS PRODUCIBLE SYSTEM FOR RAPID DETECTION OF FEVER...
- Publication number 20230084786
- Publication date Mar 16, 2023
- Seek Thermal, Inc.
- William J. Parrish
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN, TEST, AND OPERATION OF A SMALL THERMAL IMAGING CORE
- Publication number 20220260424
- Publication date Aug 18, 2022
- Seek Thermal, Inc.
- William J. Parrish
- G01 - MEASURING TESTING
Information Patent Application
NETWORK CAMERA WITH LOCAL CONTROL BUS AND THERMAL MONITORING SYSTEM...
- Publication number 20220053149
- Publication date Feb 17, 2022
- Seek Thermal, Inc.
- Blake Henry
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COST EFFECTIVE, MASS PRODUCIBLE SYSTEM FOR RAPID DETECTION OF FEVER...
- Publication number 20210295517
- Publication date Sep 23, 2021
- Seek Thermal, Inc.
- William J. Parrish
- G01 - MEASURING TESTING
Information Patent Application
COST EFFECTIVE, MASS PRODUCIBLE TEMPERATURE CONTROLLED THERMAL IMAG...
- Publication number 20210293632
- Publication date Sep 23, 2021
- Seek Thermal, Inc.
- William J. Parrish
- G01 - MEASURING TESTING
Information Patent Application
DESIGN, TEST, AND OPERATION OF A SMALL THERMAL IMAGING CORE
- Publication number 20210063244
- Publication date Mar 4, 2021
- Seek Thermal, Inc.
- William J. Parrish
- G01 - MEASURING TESTING
Information Patent Application
NETWORK CAMERA WITH LOCAL CONTROL BUS AND THERMAL MONITORING SYSTEM...
- Publication number 20200314359
- Publication date Oct 1, 2020
- Seek Thermal, Inc.
- Blake Henry
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN, TEST, AND OPERATION OF A SMALL THERMAL IMAGING CORE
- Publication number 20200217719
- Publication date Jul 9, 2020
- Seek Thermal, Inc.
- William J. Parrish
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
THERMOGRAPHY PROCESS FOR A THERMAL IMAGING SYSTEM
- Publication number 20200200608
- Publication date Jun 25, 2020
- Seek Thermal, Inc.
- Ross E. Williams
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
NETWORK CAMERA WITH LOCAL CONTROL BUS AND THERMAL MONITORING SYSTEM...
- Publication number 20200007824
- Publication date Jan 2, 2020
- Seek Thermal, Inc.
- Blake Henry
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
WAFER LEVEL PROCESSED MICROBOLOMETER FOCAL PLANE ARRAY
- Publication number 20190301942
- Publication date Oct 3, 2019
- Seek Thermal, Inc.
- William J. Parrish
- G01 - MEASURING TESTING
Information Patent Application
NETWORK CAMERA WITH LOCAL CONTROL BUS
- Publication number 20190158724
- Publication date May 23, 2019
- Seek Thermal, Inc.
- William J. Parrish
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
FIXED PATTERN NOISE MITIGATION FOR A THERMAL IMAGING SYSTEM
- Publication number 20190130535
- Publication date May 2, 2019
- Seek Thermal, Inc.
- Ross Williams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA DIGITIZATION AND DISPLAY FOR AN IMAGING SYSTEM
- Publication number 20190028658
- Publication date Jan 24, 2019
- Seek Thermal, Inc.
- William J. Parrish
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
IMAGE ADJUSTMENT BASED ON LOCALLY FLAT SCENES
- Publication number 20180315171
- Publication date Nov 1, 2018
- Seek Thermal, Inc.
- Jeffrey Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE ADJUSTMENT BASED ON LOCALLY FLAT SCENES
- Publication number 20180276803
- Publication date Sep 27, 2018
- Seek Thermal, Inc.
- Jeffrey Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THERMOGRAPHY PROCESS FOR A THERMAL IMAGING SYSTEM
- Publication number 20180180485
- Publication date Jun 28, 2018
- Seek Thermal, Inc.
- Ross Macmillan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
LOCAL CONTRAST ADJUSTMENT FOR DIGITAL IMAGES
- Publication number 20170372458
- Publication date Dec 28, 2017
- Seek Thermal, Inc.
- Andreas Engberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FIXED PATTERN NOISE MITIGATION FOR A THERMAL IMAGING SYSTEM
- Publication number 20170374304
- Publication date Dec 28, 2017
- Ross Williams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GAIN CALIBRATION FOR AN IMAGING SYSTEM
- Publication number 20170179912
- Publication date Jun 22, 2017
- Seek Thermal, Inc.
- Jason Wolfe
- G01 - MEASURING TESTING
Information Patent Application
THERMAL IMAGING BASED MONITORING SYSTEM
- Publication number 20170150069
- Publication date May 25, 2017
- Seek Thermal, Inc.
- William J. Parrish
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TIME BASED OFFSET CORRECTION FOR IMAGING SYSTEMS AND ADAPTIVE CALIB...
- Publication number 20160198102
- Publication date Jul 7, 2016
- Seek Thermal, Inc.
- Romeo Chahine
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IMAGE ADJUSTMENT BASED ON LOCALLY FLAT SCENES
- Publication number 20160156858
- Publication date Jun 2, 2016
- Seek Thermal, Inc.
- Jeffery Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIOMETRIC TEST AND CONFIGURATION OF AN INFRARED FOCAL PLANE ARRAY...
- Publication number 20160061883
- Publication date Mar 3, 2016
- Seek Thermal, Inc.
- Andreas Engberg
- G01 - MEASURING TESTING

William J. Parrish

Person

Patents Grantslast 30 patents

Design, test, and operation of a small thermal imaging core

Cost effective, mass producible temperature controlled thermal imag...

Design, test, and operation of a small thermal imaging core

Design, test, and operation of a small thermal imaging core

Cost effective, mass producible system for rapid detection of fever...

Design, test, and operation of a small thermal imaging core

Wafer level processed microbolometer focal plane array

Thermography process for converting signal to temperature in a ther...

Fixed pattern noise mitigation for a thermal imaging system

Thermography process for converting signal to temperature in a ther...

Image adjustment based on locally flat scenes

Image adjustment based on locally flat scenes

Method of producing an optical element

Combination flashlight and camera

Fixed pattern noise mitigation for a thermal imaging system

Local contrast adjustment for digital images

Gain calibration for an imaging system

Data digitization and display for an imaging system

Image adjustment based on locally flat scenes

Time based offset correction for imaging systems

Time based offset correction for imaging systems and adaptive calib...

Shutter for an infrared camera

Radiometric test and configuration of an infrared focal plane array...

Local contrast adjustment for digital images

Gain calibration for an imaging system

Infrared camera packaging

Bolometer array compensation

Infrared camera packaging

Infrared camera electronic architectures

Microbolometer focal plane array systems and methods

Patents Applicationslast 30 patents

THERMAL IMAGING CAMERA MODULE CONFIGURED FOR INTEGRATION INTO A HOS...

COST EFFECTIVE, MASS PRODUCIBLE TEMPERATURE CONTROLLED THERMAL IMAG...

DESIGN, TEST, AND OPERATION OF A SMALL THERMAL IMAGING CORE

NOISE REDUCTION AND FEATURE ENHANCEMENT FOR A THERMAL IMAGING CAMERA

NOISE REDUCTION AND FEATURE ENHANCEMENT FOR A THERMAL IMAGING CAMERA

THERMAL IMAGING CAMERA MODULE CONFIGURED FOR INTEGRATION INTO A HOS...

COST EFFECTIVE, MASS PRODUCIBLE SYSTEM FOR RAPID DETECTION OF FEVER...

DESIGN, TEST, AND OPERATION OF A SMALL THERMAL IMAGING CORE

NETWORK CAMERA WITH LOCAL CONTROL BUS AND THERMAL MONITORING SYSTEM...

COST EFFECTIVE, MASS PRODUCIBLE SYSTEM FOR RAPID DETECTION OF FEVER...

COST EFFECTIVE, MASS PRODUCIBLE TEMPERATURE CONTROLLED THERMAL IMAG...

DESIGN, TEST, AND OPERATION OF A SMALL THERMAL IMAGING CORE

NETWORK CAMERA WITH LOCAL CONTROL BUS AND THERMAL MONITORING SYSTEM...

DESIGN, TEST, AND OPERATION OF A SMALL THERMAL IMAGING CORE

THERMOGRAPHY PROCESS FOR A THERMAL IMAGING SYSTEM

NETWORK CAMERA WITH LOCAL CONTROL BUS AND THERMAL MONITORING SYSTEM...

WAFER LEVEL PROCESSED MICROBOLOMETER FOCAL PLANE ARRAY

NETWORK CAMERA WITH LOCAL CONTROL BUS

FIXED PATTERN NOISE MITIGATION FOR A THERMAL IMAGING SYSTEM

DATA DIGITIZATION AND DISPLAY FOR AN IMAGING SYSTEM

IMAGE ADJUSTMENT BASED ON LOCALLY FLAT SCENES

IMAGE ADJUSTMENT BASED ON LOCALLY FLAT SCENES

THERMOGRAPHY PROCESS FOR A THERMAL IMAGING SYSTEM

LOCAL CONTRAST ADJUSTMENT FOR DIGITAL IMAGES

FIXED PATTERN NOISE MITIGATION FOR A THERMAL IMAGING SYSTEM

GAIN CALIBRATION FOR AN IMAGING SYSTEM

THERMAL IMAGING BASED MONITORING SYSTEM

TIME BASED OFFSET CORRECTION FOR IMAGING SYSTEMS AND ADAPTIVE CALIB...

IMAGE ADJUSTMENT BASED ON LOCALLY FLAT SCENES

RADIOMETRIC TEST AND CONFIGURATION OF AN INFRARED FOCAL PLANE ARRAY...