William L. McCardel

Person

Plano, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Color correction for radiation detectors
- Patent number 8,153,980
- Issue date Apr 10, 2012
- L-3 Communications Corp.
- John F. Brady
- G01 - MEASURING TESTING
Information Patent Grant
Infrared detector elements and methods of forming same
- Patent number 7,655,909
- Issue date Feb 2, 2010
- L-3 Communications Corporation
- Thomas R. Schimert
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for bonding
- Patent number 7,462,831
- Issue date Dec 9, 2008
- L-3 Communications Corporation
- Roland W. Gooch
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for integrating focal plane arrays
- Patent number 7,459,686
- Issue date Dec 2, 2008
- L-3 Communications Corporation
- Athanasios J. Syllaios
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optically blocked reference pixels for focal plane arrays
- Patent number 7,375,331
- Issue date May 20, 2008
- L-3 Communications Corporation
- Thomas R. Schimert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optically blocked reference pixels for focal plane arrays
- Patent number 7,262,412
- Issue date Aug 28, 2007
- L-3 Communications Corporation
- Thomas R. Schimert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microbolometer and method for forming
- Patent number 6,690,014
- Issue date Feb 10, 2004
- Raytheon Company
- Roland W. Gooch
- G01 - MEASURING TESTING
Information Patent Grant
High frequency infrared emitter
- Patent number 6,297,511
- Issue date Oct 2, 2001
- Raytheon Company
- Athanasios J. Syllaios
- F41 - WEAPONS
Information Patent Grant
Bolometer autocalibration
- Patent number 6,064,066
- Issue date May 16, 2000
- Texas Insruments Incorporated
- Malcolm J. Bevan
- G01 - MEASURING TESTING
Information Patent Grant
Electronic chopping
- Patent number 6,028,312
- Issue date Feb 22, 2000
- Texas Instruments Incorporated
- Mark V. Wadsworth
- G01 - MEASURING TESTING
Information Patent Grant
Nondispersive infrared gas analyzer and gas sample chamber used the...
- Patent number 5,453,620
- Issue date Sep 26, 1995
- Texas Instruments Incorporated
- Mark V. Wadsworth
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optically blocked reference pixels for focal plane arrays
- Publication number 20070262407
- Publication date Nov 15, 2007
- L-3 Integrated Systems Company
- Thomas R. Schimert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and methods for integrating focal plane arrays
- Publication number 20070170359
- Publication date Jul 26, 2007
- Athanasios J. Syllaios
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Systems and methods for bonding
- Publication number 20070170360
- Publication date Jul 26, 2007
- Roland W. Gooch
- G01 - MEASURING TESTING
Information Patent Application
Infrared detector elements and methods of forming same
- Publication number 20070170363
- Publication date Jul 26, 2007
- Thomas R. Schimert
- G01 - MEASURING TESTING
Information Patent Application
Optically blocked reference pixels for focal plane arrays
- Publication number 20060124831
- Publication date Jun 15, 2006
- Thomas R. Schimert
- H01 - BASIC ELECTRIC ELEMENTS

William L. McCardel

Person

Patents Grantslast 30 patents

Color correction for radiation detectors

Infrared detector elements and methods of forming same

Systems and methods for bonding

Systems and methods for integrating focal plane arrays

Optically blocked reference pixels for focal plane arrays

Optically blocked reference pixels for focal plane arrays

Microbolometer and method for forming

High frequency infrared emitter

Bolometer autocalibration

Electronic chopping

Nondispersive infrared gas analyzer and gas sample chamber used the...

Patents Applicationslast 30 patents

Optically blocked reference pixels for focal plane arrays

Systems and methods for integrating focal plane arrays

Systems and methods for bonding

Infrared detector elements and methods of forming same

Optically blocked reference pixels for focal plane arrays