Palmdale, CA, US
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Patent Grant
U.S.A, as Represented by the Administrator of the National Aeronautics and Sp...
Scott Michael Strutner
G01 - MEASURING TESTING
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Patent Grant
United States of America as represented by the Administrator of the National...
Francisco Pena
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Allen R Parker
G02 - OPTICS
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Patent Grant
The United States of America, as Represented by the Adminstrator of NASA
Gregory P. Carman
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Allen R Parker
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Grant
The United States of America as represented by the National Aeronautics and S...
William Lance Richards
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the administrator of the Natio...
William L. Ko
G01 - MEASURING TESTING
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Patent Application
Allen R. Parker
G02 - OPTICS
