William McMahon

Person

Tuckahoe, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods, apparatus and system for screening process splits for tech...
- Patent number 10,054,630
- Issue date Aug 21, 2018
- GLOBALFOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus, and system for targeted healing of write fails t...
- Patent number 9,916,212
- Issue date Mar 13, 2018
- GLOBALFOUNDRIES Inc.
- Akhilesh Gautam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods, apparatus and system for screening process splits for tech...
- Patent number 9,702,926
- Issue date Jul 11, 2017
- GLOBALFOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus and system for targeted healing of stability fail...
- Patent number 9,601,188
- Issue date Mar 21, 2017
- GLOBALFOUNDRIES Inc.
- Akhilesh Gautam
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods, apparatus and system for voltage ramp testing
- Patent number 9,599,656
- Issue date Mar 21, 2017
- GLOBALFOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus, and system for global healing of stability-limit...
- Patent number 9,601,187
- Issue date Mar 21, 2017
- GLOBALFOUNDRIES Inc.
- Akhilesh Gautam
- G11 - INFORMATION STORAGE
Information Patent Grant
Method to identify extrinsic SRAM bits for failure analysis based o...
- Patent number 9,548,136
- Issue date Jan 17, 2017
- GLOBALFOUNDRIES Inc.
- Vivek Joshi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor structure having test device
- Patent number 9,500,703
- Issue date Nov 22, 2016
- GLOBALFOUNDRIES Inc.
- Anil Kumar
- G01 - MEASURING TESTING
Information Patent Grant
Wafer test structures and methods of providing wafer test structures
- Patent number 9,372,226
- Issue date Jun 21, 2016
- GLOBALFOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with stress generator for stressing test devices
- Patent number 8,907,687
- Issue date Dec 9, 2014
- GLOBALFOUNDRIES Inc.
- William McMahon
- G11 - INFORMATION STORAGE
Information Patent Grant
Devices having bias temperature instability compensation
- Patent number 8,817,570
- Issue date Aug 26, 2014
- GLOBALFOUNDRIES, INC.
- William McMahon
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
METHODS, APPARATUS, AND SYSTEM FOR GLOBAL HEALING OF WRITE-LIMITED...
- Publication number 20170271032
- Publication date Sep 21, 2017
- GLOBALFOUNDRIES INC.
- Akhilesh Gautam
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD, APPARATUS, AND SYSTEM FOR TARGETED HEALING OF WRITE FAILS T...
- Publication number 20170242759
- Publication date Aug 24, 2017
- GLOBALFOUNDRIES INC.
- Akhilesh Gautam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD TO IDENTIFY EXTRINSIC SRAM BITS FOR FAILURE ANALYSIS BASED O...
- Publication number 20160284421
- Publication date Sep 29, 2016
- GLOBALFOUNDRIES INC.
- Vivek JOSHI
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS, APPARATUS AND SYSTEM FOR VOLTAGE RAMP TESTING
- Publication number 20160146879
- Publication date May 26, 2016
- GLOBAL FOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR STRUCTURE HAVING TEST DEVICE
- Publication number 20160054383
- Publication date Feb 25, 2016
- GLOBALFOUNDRIES INC.
- Anil KUMAR
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST STRUCTURES AND METHODS OF PROVIDING WAFER TEST STRUCTURES
- Publication number 20160025805
- Publication date Jan 28, 2016
- GLOBALFOUNDRIES INC.
- Suresh UPPAL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INLINE DEVICE CHARACTERIZATION AND TEMPERA...
- Publication number 20150377956
- Publication date Dec 31, 2015
- GLOBALFOUNDRIES INC.
- William MCMAHON
- G01 - MEASURING TESTING
Information Patent Application
METHODS, APPARATUS AND SYSTEM FOR SCREENING PROCESS SPLITS FOR TECH...
- Publication number 20150346271
- Publication date Dec 3, 2015
- GLOBALFOUNDRIES INC.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH STRESS GENERATOR FOR STRESSING TEST DEVICES
- Publication number 20130293250
- Publication date Nov 7, 2013
- GLOBALFOUNDRIES INC.
- William McMahon
- G01 - MEASURING TESTING
Information Patent Application
DEVICES HAVING BIAS TEMPERATURE INSTABILITY COMPENSATION
- Publication number 20130208555
- Publication date Aug 15, 2013
- GLOBALFOUNDRIES INC.
- William McMahon
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS FOR RELIABILITY TESTING OF SEMICONDUCTOR DEVICES
- Publication number 20130033285
- Publication date Feb 7, 2013
- GLOBALFOUNDRIES INC.
- William McMahon
- G01 - MEASURING TESTING

William McMahon

Person

Patents Grantslast 30 patents

Methods, apparatus and system for screening process splits for tech...

Method, apparatus, and system for targeted healing of write fails t...

Methods, apparatus and system for screening process splits for tech...

Method, apparatus and system for targeted healing of stability fail...

Methods, apparatus and system for voltage ramp testing

Method, apparatus, and system for global healing of stability-limit...

Method to identify extrinsic SRAM bits for failure analysis based o...

Semiconductor structure having test device

Wafer test structures and methods of providing wafer test structures

Integrated circuit with stress generator for stressing test devices

Devices having bias temperature instability compensation

Patents Applicationslast 30 patents

METHODS, APPARATUS, AND SYSTEM FOR GLOBAL HEALING OF WRITE-LIMITED...

METHOD, APPARATUS, AND SYSTEM FOR TARGETED HEALING OF WRITE FAILS T...

METHOD TO IDENTIFY EXTRINSIC SRAM BITS FOR FAILURE ANALYSIS BASED O...

METHODS, APPARATUS AND SYSTEM FOR VOLTAGE RAMP TESTING

SEMICONDUCTOR STRUCTURE HAVING TEST DEVICE

WAFER TEST STRUCTURES AND METHODS OF PROVIDING WAFER TEST STRUCTURES

METHOD AND APPARATUS FOR INLINE DEVICE CHARACTERIZATION AND TEMPERA...

METHODS, APPARATUS AND SYSTEM FOR SCREENING PROCESS SPLITS FOR TECH...

INTEGRATED CIRCUIT WITH STRESS GENERATOR FOR STRESSING TEST DEVICES

DEVICES HAVING BIAS TEMPERATURE INSTABILITY COMPENSATION

METHODS FOR RELIABILITY TESTING OF SEMICONDUCTOR DEVICES