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William P. Pardee
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Redding, CT, US
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last 30 patents
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Patent Grant
Planarizing interposer for thermal compensation of a probe card
Patent number
6,756,797
Issue date
Jun 29, 2004
Wentworth Laboratories Inc.
Alexander Brandorff
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Planarizing interposer
Publication number
20020109514
Publication date
Aug 15, 2002
Wentworth Laboratories, Inc.
Alexander Brandorff
G01 - MEASURING TESTING