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William P. Winfree
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Williamsburg, VA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Air-coupled acoustic thermography for in-situ evaluation
Patent number
7,855,368
Issue date
Dec 21, 2010
The United States of America as represented by the administrator of the Natio...
Joseph N. Zalameda
G01 - MEASURING TESTING
Information
Patent Grant
Synchronized electronic shutter system and method for thermal nonde...
Patent number
6,712,502
Issue date
Mar 30, 2004
The United States of America as represented by the administrator of the Natio...
Joseph N. Zalameda
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for the portable identification of material th...
Patent number
6,000,844
Issue date
Dec 14, 1999
The United States of America as represented by the administrator of the Natio...
K. Elliott Cramer
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for thermographically and quantitatively analy...
Patent number
5,562,345
Issue date
Oct 8, 1996
The United States of America as represented by the administrator of the Natio...
Joseph S. Heyman
G01 - MEASURING TESTING
Information
Patent Grant
Method of remotely characterizing thermal properties of a sample
Patent number
5,131,758
Issue date
Jul 21, 1992
Administrator of the National Aeronautics and Space Administration
Joseph S. Heyman
G01 - MEASURING TESTING
Information
Patent Grant
Thermal remote anemometer system
Patent number
5,085,073
Issue date
Feb 4, 1992
The United States of America as represented by the Administator of the United...
Joseph S. Heyman
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Air-Coupled Acoustic Thermography for In-Situ Evaluation
Publication number
20100019153
Publication date
Jan 28, 2010
USA as represented by the Administrator of the National Aeronautics and Space...
Joseph N. Zalameda
G01 - MEASURING TESTING
Information
Patent Application
Synchronized electronic shutter system and method for thermal nonde...
Publication number
20030193987
Publication date
Oct 16, 2003
Joseph N. Zalameda
G01 - MEASURING TESTING