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William R. Bottoms
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Palo Alto, CA, US
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last 30 patents
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Patent Grant
Structures and processes for fabrication of probe card assemblies w...
Patent number
8,575,954
Issue date
Nov 5, 2013
Advantest (Singapore) Pte Ltd
Fu Chiung Chong
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Structures and Processes for Fabrication of Probe Card Assemblies w...
Publication number
20100244867
Publication date
Sep 30, 2010
Fu Chiung Chong
G01 - MEASURING TESTING