William R. Lawrence

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Ft. Collins, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing integrated circuit devices
- Patent number 6,392,423
- Issue date May 21, 2002
- Agilent Technologies, Inc.
- Bradley D. Pace
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing integrated circuit devices
- Patent number 6,285,200
- Issue date Sep 4, 2001
- Agilent Technologies, Inc.
- Bradley D. Pace
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a display using a relatively lo...
- Patent number 6,219,443
- Issue date Apr 17, 2001
- Agilent Technologies, Inc.
- William Richard Lawrence
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for verifying signal timing accuracy on a digital testing de...
- Patent number 6,192,496
- Issue date Feb 20, 2001
- Agilent Technologies, Inc.
- William R. Lawrence
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for automated signal integrity checking based...
- Publication number 20040015737
- Publication date Jan 22, 2004
- Robert J. Martin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for automated signal integrity checking
- Publication number 20040015338
- Publication date Jan 22, 2004
- William Richard Lawrence
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for testing integrated circuit devices
- Publication number 20010019275
- Publication date Sep 6, 2001
- Bradley D. Pace
- G01 - MEASURING TESTING