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William R. Stott
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King City, CA
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Patents Grants
last 30 patents
Information
Patent Grant
Non-contact trace chemical screening
Patent number
9,048,076
Issue date
Jun 2, 2015
MSDetection Corp.
William R. Stott
G01 - MEASURING TESTING
Information
Patent Grant
Fragmentation of ions by resonant excitation in a high order multip...
Patent number
7,227,137
Issue date
Jun 5, 2007
MDS Inc.
Frank Londry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fragmentation of ions by resonant excitation in a high order multip...
Patent number
7,049,580
Issue date
May 23, 2006
MDS Inc.
Frank Londry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and apparatus for reducing artifacts in mass spectrometers
Patent number
6,909,089
Issue date
Jun 21, 2005
MDS Inc.
Frank R. Londry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for tandem ICP/FAIMS/MS
Patent number
6,799,355
Issue date
Oct 5, 2004
National Research Council Canada
Roger Guevremont
G01 - MEASURING TESTING
Information
Patent Grant
Axial ejection resolution in multipole mass spectrometers
Patent number
6,703,607
Issue date
Mar 9, 2004
MDS Inc.
William R. Stott
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
NON-CONTACT TRACE CHEMICAL SCREENING
Publication number
20150311053
Publication date
Oct 29, 2015
MSDETECTION CORP.
WILLIAM R. STOTT
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
REDUCED PRESSURE LIQUID SAMPLING
Publication number
20140190245
Publication date
Jul 10, 2014
David Rafferty
G01 - MEASURING TESTING
Information
Patent Application
NON-CONTACT TRACE CHEMICAL SCREENING
Publication number
20140117223
Publication date
May 1, 2014
MSDETECTION CORP.
William R. Stott
G01 - MEASURING TESTING
Information
Patent Application
Fragmentation of ions by resonant excitation in a high order multip...
Publication number
20050178963
Publication date
Aug 18, 2005
Frank Londry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods and apparatus for reducing artifacts in mass spectrometers
Publication number
20040011956
Publication date
Jan 22, 2004
Frank R. Londry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
AXIAL EJECTION RESOLUTION IN MULTIPOLE MASS SPECTROMETERS
Publication number
20030222210
Publication date
Dec 4, 2003
William R. Stott
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method for tandem icp/faims/ms
Publication number
20030213904
Publication date
Nov 20, 2003
Roger Guevremont
G01 - MEASURING TESTING
Information
Patent Application
Fragmentation of ions by resonant excitation in a low pressure ion...
Publication number
20030189168
Publication date
Oct 9, 2003
Frank Londry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Fragmentation of ions by resonant excitation in a high order multip...
Publication number
20030189171
Publication date
Oct 9, 2003
Frank Londry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method for tandem icp/faims/ms
Publication number
20030089849
Publication date
May 15, 2003
Roger Guevremont
G01 - MEASURING TESTING