William Randall Cason

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Tewksbury, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Backscatter system with variable size of detector array
- Patent number 8,903,045
- Issue date Dec 2, 2014
- American Science and Engineering, Inc.
- Jeffrey R. Schubert
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection based on scatter detection
- Patent number 7,551,715
- Issue date Jun 23, 2009
- American Science and Engineering, Inc.
- Peter Rothschild
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Wide-Area Motion Imaging Systems and Methods
- Publication number 20210101678
- Publication date Apr 8, 2021
- Cindy Y. FANG
- G05 - CONTROLLING REGULATING
Information Patent Application
Backscatter System with Variable Size of Detector Array
- Publication number 20120263276
- Publication date Oct 18, 2012
- American Science and Engineering, Inc.
- Jeffrey R. Schubert
- G01 - MEASURING TESTING
Information Patent Application
Concentric Dual Drum Raster Scanning Beam System and Method
- Publication number 20070172031
- Publication date Jul 26, 2007
- William Randall Cason
- G02 - OPTICS
Information Patent Application
X-Ray Inspection Based on Scatter Detection
- Publication number 20070098142
- Publication date May 3, 2007
- Peter Rothschild
- G01 - MEASURING TESTING