William T. Elam

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Redmond, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Scatter spectra method for x-ray fluorescent analysis with optical...
- Patent number 6,845,147
- Issue date Jan 18, 2005
- EDAX Inc.
- William T. Elam
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
Scatter spectra method for x-ray fluorescent analysis with optical...
- Publication number 20040066886
- Publication date Apr 8, 2004
- William T. Elam
- G01 - MEASURING TESTING