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William T. Lee
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San Jose, CA, US
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last 30 patents
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Patent Grant
Optimal probe point placement
Patent number
5,675,499
Issue date
Oct 7, 1997
Schlumberger Technologies Inc.
William T. Lee
G01 - MEASURING TESTING
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Patent Grant
Method of probing a net of an IC at an optimal probe-point
Patent number
5,530,372
Issue date
Jun 25, 1996
Schlumberger Technologies, Inc.
William T. Lee
G01 - MEASURING TESTING