William T. WALKER

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Suffolk, GB

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Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection system, an x-ray imaging accessory, a sample suppo...
- Patent number 12,332,189
- Issue date Jun 17, 2025
- Nordson Corporation
- Bill Walker
- G01 - MEASURING TESTING
Information Patent Grant
Binder permeated ionizing radiation shielding panels, method of con...
- Patent number 11,342,090
- Issue date May 24, 2022
- Nordson Corporation
- Bill Walker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection apparatus for inspecting semiconductor wafers
- Patent number 10,948,425
- Issue date Mar 16, 2021
- Nordson Corporation
- William T. Walker
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 10,393,675
- Issue date Aug 27, 2019
- Nordson Corporation
- John Tingay
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus for inspecting semiconductor wafers
- Patent number 10,215,716
- Issue date Feb 26, 2019
- Nordson Corporation
- John Tingay
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AN X-RAY INSPECTION SYSTEM, AN X-RAY IMAGING ACCESSORY, A SAMPLE SU...
- Publication number 20230304946
- Publication date Sep 28, 2023
- Nordson Corporation
- Bill Walker
- G01 - MEASURING TESTING
Information Patent Application
BINDER PERMEATED IONIZING RADIATION SHIELDING PANELS, METHOD OF CON...
- Publication number 20210166828
- Publication date Jun 3, 2021
- Nordson Corporation
- Bill Walker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR WAFERS
- Publication number 20170122883
- Publication date May 4, 2017
- Nordson Corporation
- William T. WALKER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20170025317
- Publication date Jan 26, 2017
- Nordson Corporation
- John TINGAY
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR WAFERS
- Publication number 20170018467
- Publication date Jan 19, 2017
- Nordson Corporation
- William T. WALKER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR WAFERS
- Publication number 20170011973
- Publication date Jan 12, 2017
- Nordson Corporation
- John Tingay
- G01 - MEASURING TESTING