TREA

William Thurston

Follow

Person

  • Kansas City, MO, US
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Interconnect system
    • Patent number 8,575,953
    • Issue date Nov 5, 2013
    • Interconnect Devices, Inc.
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe with contact ring
    • Patent number 7,362,118
    • Issue date Apr 22, 2008
    • Interconnect Devices, Inc.
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Eccentric offset Kelvin probe
    • Patent number 7,298,153
    • Issue date Nov 20, 2007
    • Interconnect Devices, Inc.
    • Jason W. Farris
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Dual tapered spring probe
    • Patent number 7,154,286
    • Issue date Dec 26, 2006
    • Interconnect Devices, Inc.
    • Donald A. Marx
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Algoristic spring as probe
    • Patent number 7,148,713
    • Issue date Dec 12, 2006
    • Interconnect Devices, Inc.
    • Ronald L. Meek
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electrical contact interface
    • Patent number 6,506,082
    • Issue date Jan 14, 2003
    • Interconnect Devices, Inc.
    • Ron Meek
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Probe and test socket assembly
    • Patent number 6,424,166
    • Issue date Jul 23, 2002
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spring contact twister probe for testing electrical printed circuit...
    • Patent number 5,009,613
    • Issue date Apr 23, 1991
    • Interconnect Devices, Inc.
    • Ulf R. Langgard
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Interconnect System
    • Publication number 20110312229
    • Publication date Dec 22, 2011
    • Interconnect Devices, Inc.
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Application

    INTERCONNECT SYSTEM
    • Publication number 20090289647
    • Publication date Nov 26, 2009
    • INTERCONNECT DEVICES, INC.
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe with contact ring
    • Publication number 20080048701
    • Publication date Feb 28, 2008
    • David W. Henry
    • G01 - MEASURING TESTING
  • Information Patent Application

    DUAL TAPERED SPRING PROBE
    • Publication number 20070001695
    • Publication date Jan 4, 2007
    • Donald A. Marx
    • G01 - MEASURING TESTING
  • Information Patent Application

    Eccentric offset Kelvin probe
    • Publication number 20060267601
    • Publication date Nov 30, 2006
    • Jason W. Farris
    • G01 - MEASURING TESTING
  • Information Patent Application

    Electrical contact spring probe with RF shielding
    • Publication number 20030042883
    • Publication date Mar 6, 2003
    • William E. Thurston
    • G01 - MEASURING TESTING