William VANDENDAELE

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Grenoble, FR

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Patents Grantslast 30 patents

Information Patent Grant
Transistor characterization
- Patent number 11,656,267
- Issue date May 23, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Abygael Viey
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETERMINING A CET MAP, METHOD FOR DETERMINING THE ACTIVA...
- Publication number 20220299559
- Publication date Sep 22, 2022
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Abygael VIEY
- G01 - MEASURING TESTING
Information Patent Application
TRANSISTOR CHARACTERIZATION
- Publication number 20210302487
- Publication date Sep 30, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Abygael Viey
- G01 - MEASURING TESTING
Information Patent Application
CONCENTRATION ESTIMATION METHOD
- Publication number 20210156812
- Publication date May 27, 2021
- Commissariat à l'Énergie Atomique et aux l'Énergies Alternatives
- Abygael Viey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR CHARACTERIZING A POWER DIODE
- Publication number 20190271736
- Publication date Sep 5, 2019
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- William VANDENDAELE
- G01 - MEASURING TESTING
Information Patent Application
NANOWIRE-BASED OPTOELECTRONIC SEMICONDUCTOR STRUCTURE AND METHOD OF...
- Publication number 20130256689
- Publication date Oct 3, 2013
- COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENE. ALT.
- Emilie POUGEOISE
- B82 - NANO-TECHNOLOGY