William VanHoomissen

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for cleaning wafer handling equipment
- Patent number 11,524,319
- Issue date Dec 13, 2022
- KLA Corporation
- William VanHoomissen
- B08 - CLEANING
Information Patent Grant
Haze mask system for haze suppression
- Patent number 10,522,426
- Issue date Dec 31, 2019
- KLA-Tencor Corporation
- Hongxing Yuan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting cracks in a wafer
- Patent number 9,255,894
- Issue date Feb 9, 2016
- KLA-Tencor Corporation
- William VanHoomissen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and Method for Cleaning Wafer Handling Equipment
- Publication number 20180021818
- Publication date Jan 25, 2018
- William VanHoomissen
- B08 - CLEANING
Information Patent Application
System and Method for Detecting Cracks in a Wafer
- Publication number 20140152976
- Publication date Jun 5, 2014
- KLA-Tencor Corporation
- William VanHoomissen
- G01 - MEASURING TESTING