William W. Chism II

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for high precision optical characterization of...
- Patent number 11,940,488
- Issue date Mar 26, 2024
- XCalipr Corporation
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Grant
High precision optical characterization of carrier transport proper...
- Patent number 11,402,429
- Issue date Aug 2, 2022
- XCalipr Corporation
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Grant
High precision optical characterization of carrier transport proper...
- Patent number 10,921,369
- Issue date Feb 16, 2021
- XCalipr Corporation
- William W. Chism
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR PHOTOREFLECTANCE SPECTROSCOPY USING PARALLE...
- Publication number 20230084219
- Publication date Mar 16, 2023
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR HIGH PRECISION OPTICAL CHARACTERIZATION OF...
- Publication number 20220291281
- Publication date Sep 15, 2022
- XCALIPR CORPORATION
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Application
HIGH PRECISION OPTICAL CHARACTERIZATION OF CARRIER TRANSPORT PROPER...
- Publication number 20210165040
- Publication date Jun 3, 2021
- XCALIPR CORPORATION
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Application
High Precision Optical Characterization of Carrier Transport Proper...
- Publication number 20180188319
- Publication date Jul 5, 2018
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Application
Method of direct coulomb explosion in laser ablation of semiconduct...
- Publication number 20070293057
- Publication date Dec 20, 2007
- William W. Chism
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method of photo-reflectance characterization of strain and active d...
- Publication number 20070097370
- Publication date May 3, 2007
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Application
Polarization modulation photoreflectance characterization of semico...
- Publication number 20060098198
- Publication date May 11, 2006
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Application
Laser stimulated atom probe characterization of semiconductor and d...
- Publication number 20050017174
- Publication date Jan 27, 2005
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Application
Polarization modulation photoreflectance characterization of semico...
- Publication number 20040257566
- Publication date Dec 23, 2004
- William W. Chism
- G01 - MEASURING TESTING

William W. Chism II

Person

Patents Grantslast 30 patents

Systems and methods for high precision optical characterization of...

High precision optical characterization of carrier transport proper...

High precision optical characterization of carrier transport proper...

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR PHOTOREFLECTANCE SPECTROSCOPY USING PARALLE...

SYSTEMS AND METHODS FOR HIGH PRECISION OPTICAL CHARACTERIZATION OF...

HIGH PRECISION OPTICAL CHARACTERIZATION OF CARRIER TRANSPORT PROPER...

High Precision Optical Characterization of Carrier Transport Proper...

Method of direct coulomb explosion in laser ablation of semiconduct...

Method of photo-reflectance characterization of strain and active d...

Polarization modulation photoreflectance characterization of semico...

Laser stimulated atom probe characterization of semiconductor and d...

Polarization modulation photoreflectance characterization of semico...