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William W. Oldfield
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Redwood City, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Sex changeable adapter for coaxial connectors
Patent number
7,108,527
Issue date
Sep 19, 2006
Anritsu Company
William W. Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Hermetic glass bead assembly having high frequency compensation
Patent number
7,011,529
Issue date
Mar 14, 2006
Anritsu Company
William W. Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing a microstrip edge ground termination
Patent number
6,660,174
Issue date
Dec 9, 2003
Anritsu Company
William W. Oldfield
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Right angle coaxial cable connections to microwave components on a...
Patent number
6,628,182
Issue date
Sep 30, 2003
Anritsu Company
William W. Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High frequency hermetic connector with ground lip
Patent number
6,604,949
Issue date
Aug 12, 2003
Anritsu Company
William Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microstrip dot termination usable with optical modulators
Patent number
6,593,829
Issue date
Jul 15, 2003
Anritsu Company
William Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
RMS power sensor with 84 dB dynamic range
Patent number
6,548,999
Issue date
Apr 15, 2003
Anritsu Company
Vincent W. C. Wong
G01 - MEASURING TESTING
Information
Patent Grant
System and method for improved microstrip termination
Patent number
6,525,631
Issue date
Feb 25, 2003
Anritsu Company
William W. Oldfield
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Lumped element microwave inductor with windings around tapered poly...
Patent number
6,509,821
Issue date
Jan 21, 2003
Anritsu Company
William W. Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
RMS power sensor with 84 dB dynamic range
Patent number
6,331,769
Issue date
Dec 18, 2001
Anritsu Company
Vincent W. C. Wong
G01 - MEASURING TESTING
Information
Patent Grant
Dual mode diode power sensor with square law and linear operating r...
Patent number
6,291,984
Issue date
Sep 18, 2001
Anritsu Company
Vincent W. C. Wong
G01 - MEASURING TESTING
Information
Patent Grant
Wafer probe with built in RF frequency conversion module
Patent number
6,169,410
Issue date
Jan 2, 2001
Anritsu Company
Martin I. Grace
G01 - MEASURING TESTING
Information
Patent Grant
Connector having an axial resilient inner and outer conductors
Patent number
6,053,755
Issue date
Apr 25, 2000
Anritsu Company
William Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Connector saving adapters and SWR bridge configuration allowing mul...
Patent number
6,049,212
Issue date
Apr 11, 2000
Wiltron Company
William W. Oldfield
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring and/or injecting high frequency signals in...
Patent number
5,905,421
Issue date
May 18, 1999
Wiltron Company
William Oldfield
G01 - MEASURING TESTING
Information
Patent Grant
SWR bridge configuration enabling extended precision and measuremen...
Patent number
5,831,440
Issue date
Nov 3, 1998
Wiltron Company
William W. Oldfield
G01 - MEASURING TESTING
Information
Patent Grant
Method of updating automatic calibration to provide a perceived per...
Patent number
5,825,669
Issue date
Oct 20, 1998
Wiltron Company
William W. Oldfield
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for providing a ground for circuits on carriers
Patent number
5,812,039
Issue date
Sep 22, 1998
William Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Frequency discriminating power sensor
Patent number
5,801,525
Issue date
Sep 1, 1998
Wiltron Company
William Oldfield
G01 - MEASURING TESTING
Information
Patent Grant
Impedance controlled test fixture for multi-lead surface mounted in...
Patent number
5,734,176
Issue date
Mar 31, 1998
Wiltron Company
William W. Oldfield
G01 - MEASURING TESTING
Information
Patent Grant
Internal automatic calibrator for vector network analyzers
Patent number
5,715,183
Issue date
Feb 3, 1998
Wiltron Company
Martin I. Grace
G01 - MEASURING TESTING
Information
Patent Grant
Automatic VNA calibration apparatus
Patent number
5,587,934
Issue date
Dec 24, 1996
Wiltron Company
William W. Oldfield
G01 - MEASURING TESTING
Information
Patent Grant
Microwave connector with an inner conductor that provides an axiall...
Patent number
5,576,675
Issue date
Nov 19, 1996
Wiltron Company
William W. Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Internal automatic calibrator for vector network analyzers
Patent number
5,548,538
Issue date
Aug 20, 1996
Wiltron Company
Martin I. Grace
G01 - MEASURING TESTING
Information
Patent Grant
Microwave coupler and method of operating same utilizing forward co...
Patent number
5,111,165
Issue date
May 5, 1992
Wiltron Company
William W. Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for multiplexing broad band high frequency sig...
Patent number
5,055,807
Issue date
Oct 8, 1991
Wiltron Company
William W. Oldfield
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for multiplexing broad band high frequency sig...
Patent number
5,053,733
Issue date
Oct 1, 1991
Wiltron Company
William W. Oldfield
G01 - MEASURING TESTING
Information
Patent Grant
Directional coupler and termination for stripline and coaxial condu...
Patent number
5,047,737
Issue date
Sep 10, 1991
Wiltron Company
William W. Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Coaxial microwave device test fixture
Patent number
5,017,865
Issue date
May 21, 1991
Wiltron Company
William W. Oldfield
G01 - MEASURING TESTING
Information
Patent Grant
Universal connector with interchangeable male and female sleeves fo...
Patent number
4,891,015
Issue date
Jan 2, 1990
Wiltron Company
William W. Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Method for forming hermetic glass bead assembly having high frequen...
Publication number
20060134939
Publication date
Jun 22, 2006
Anritsu Company
William W. Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Hermetic glass bead assembly having high frequency compensation
Publication number
20050191869
Publication date
Sep 1, 2005
Anritsu Company
William W. Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Sex changeable adapter for coaxial connectors
Publication number
20050153601
Publication date
Jul 14, 2005
Anritsu Company
William W. Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Lumped element microwave inductor with windings around tapered poly...
Publication number
20030076207
Publication date
Apr 24, 2003
Anritsu Company
William W. Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of manufacturing a microstrip edge ground termination
Publication number
20030057181
Publication date
Mar 27, 2003
William W. Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Microstrip dot termination usable with optical modulators
Publication number
20030048146
Publication date
Mar 13, 2003
William Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High frequency hermetic connector with ground lip
Publication number
20020127892
Publication date
Sep 12, 2002
William Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Microwave inductor with poly-iron core configured to limit interfer...
Publication number
20020080002
Publication date
Jun 27, 2002
William W. Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LUMPED ELEMENT MICROWAVE INDUCTOR WITH WINDINGS AROUND TAPERED POLY...
Publication number
20020057183
Publication date
May 16, 2002
WILLIAM W. OLDFIELD
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RMS power sensor with 84 dB dynamic range
Publication number
20020039021
Publication date
Apr 4, 2002
Anritsu Company
Vincent W. C. Wong
G01 - MEASURING TESTING