William Wade Sapp JR.

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Melrose, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
X-ray ambient level safety system
- Patent number 6,067,344
- Issue date May 23, 2000
- American Science and Engineering, Inc.
- Lee Grodzins
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Single-Pulse-Switched Multiple Energy X-ray Source Applications
- Publication number 20080111080
- Publication date May 15, 2008
- American Science and Engineering, Inc.
- Andrey V. Mishin
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Inspection Based on Scatter Detection
- Publication number 20070098142
- Publication date May 3, 2007
- Peter Rothschild
- G01 - MEASURING TESTING
Information Patent Application
X-ray backscatter inspection with coincident optical beam
- Publication number 20060245548
- Publication date Nov 2, 2006
- Joseph Callerame
- G01 - MEASURING TESTING