William Yu

Follow

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Built-in self-test circuitry
- Patent number 12,315,580
- Issue date May 27, 2025
- Micron Technology, Inc.
- William Yu
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test burst patterns based on architecture of memory
- Patent number 12,293,803
- Issue date May 6, 2025
- Micron Technology, Inc.
- William Yu
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
BUILT-IN SELF-TEST BURST PATTERNS BASED ON ARCHITECTURE OF MEMORY
- Publication number 20240087664
- Publication date Mar 14, 2024
- Micron Technology, Inc.
- William Yu
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST CIRCUITRY
- Publication number 20240087663
- Publication date Mar 14, 2024
- Micron Technology, Inc.
- William Yu
- G11 - INFORMATION STORAGE