Willibald Stobbe

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Donaueschinger, DE

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Patents Grantslast 30 patents

Information Patent Grant
Process and device for the parameterization of measuring device
- Patent number 8,874,401
- Issue date Oct 28, 2014
- Sick Stegmann GmbH
- Josef Siraky
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Process and device for the parameterization of measuring device
- Publication number 20080177494
- Publication date Jul 24, 2008
- Josef Siraky
- G01 - MEASURING TESTING