TREA

Willie B. Benitez III

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  • Lubbock, TX, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Method for final testing of semiconductor devices
    • Patent number 5,589,765
    • Issue date Dec 31, 1996
    • Texas Instruments Incorporated
    • Dale V. Ohmart
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Dual peak detector
    • Patent number 4,517,455
    • Issue date May 14, 1985
    • Texas Instruments Incorporated
    • Willie B. Benitez
    • G06 - COMPUTING CALCULATING COUNTING