Willie J. Yarbrough

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
OPC models generated from 2D high frequency test patterns
- Patent number 8,015,513
- Issue date Sep 6, 2011
- Texas Instruments Incorporated
- Ashesh Parikh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
OPC MODELS GENERATED FROM 2D HIGH FREQUENCY TEST PATTERNS
- Publication number 20090300557
- Publication date Dec 3, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Ashesh Parikh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY