Santa Clara, CA, US
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Patent Grant
Bayer HealthCare LLC
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G01 - MEASURING TESTING
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Patent Grant
Metrika, Inc.
Joel M. Blatt
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Grant
Metrika, Inc.
Joel M. Blatt
G01 - MEASURING TESTING
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Patent Application
PEEK TECHNOLOGIES, INC.
Wilma MANGAN
G01 - MEASURING TESTING
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Patent Application
PEEK TECHNOLOGIES, INC.
Wilma MANGAN
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Core Diagnostics Corporation
Wilma MANGAN
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Core Diagnostics Corporation
Wilma MANGAN
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
MEC DYNAMICS CORPORATION
Emmanuel Mpock
G01 - MEASURING TESTING
Information
Patent Application
MEC DYNAMICS CORPORATION
Emmanuel C. Mpock
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Emmanuel C. Mpock
G01 - MEASURING TESTING
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Patent Application
MEC Dynamics Corporation
Emmanuel Mpock
G01 - MEASURING TESTING
Information
Patent Application
MEC DYNAMICS CORPORATION
Emmanuel C. Mpock
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Joel M. Blatt
G01 - MEASURING TESTING
Information
Patent Application
Metrika, Inc.
Joel M. Blatt
G01 - MEASURING TESTING
