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Wilson K. Yee
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Tracy, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Programmable integrated circuit having built in test circuit
Patent number
7,786,749
Issue date
Aug 31, 2010
Sillcon Storage Technology, Inc.
Tsung-Lu Syu
G01 - MEASURING TESTING
Information
Patent Grant
Processing data packets at a storage service module of a switch
Patent number
7,460,528
Issue date
Dec 2, 2008
Brocade Communications Systems, Inc.
Joseph I. Chamdani
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Programmable interface for a configurable system bus
Patent number
6,754,760
Issue date
Jun 22, 2004
Xilinx, Inc.
Wilson Yee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for PLD swapping
Patent number
6,526,466
Issue date
Feb 25, 2003
Xilinx, Inc.
Scott O. Frake
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Bank-based configuration and reconfiguration for programmable logic...
Patent number
6,459,646
Issue date
Oct 1, 2002
Triscend Corporation
Wilson Yee
G11 - INFORMATION STORAGE
Information
Patent Grant
Structure and method for generating a clock enable signal in a PLD
Patent number
6,218,864
Issue date
Apr 17, 2001
Xilinx, Inc.
Steven P. Young
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Integrated circuit with field programmable and application specific...
Patent number
6,094,065
Issue date
Jul 25, 2000
Xilinx, Inc.
Danesh Tavana
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
FPGA architecture with repeatable titles including routing matrices...
Patent number
5,883,525
Issue date
Mar 16, 1999
Xilinx, Inc.
Danesh Tavana
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Integrated circuit with field programmable and application specific...
Patent number
5,825,202
Issue date
Oct 20, 1998
Xilinx, Inc.
Danesh Tavana
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
FPGA architecture with repeatable tiles including routing matrices...
Patent number
5,682,107
Issue date
Oct 28, 1997
Xilinx, Inc.
Danesh Tavana
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Programmable scan chain testing structure and method
Patent number
5,675,589
Issue date
Oct 7, 1997
Xilinx, Inc.
Wilson K. Yee
G01 - MEASURING TESTING
Information
Patent Grant
Programmable scan chain testing structure and method
Patent number
5,550,843
Issue date
Aug 27, 1996
Xilinx, Inc.
Wilson K. Yee
G01 - MEASURING TESTING
Information
Patent Grant
Field programmable gate array providing contention free configurati...
Patent number
5,453,706
Issue date
Sep 26, 1995
Xilinx, Inc.
Wilson K. Yee
H03 - BASIC ELECTRONIC CIRCUITRY