Wim DOBBELAERE

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Ninove, BE

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Patents Grantslast 30 patents

Information Patent Grant
Process variation as die level traceability
- Patent number 11,233,013
- Issue date Jan 25, 2022
- Semiconductor Components Industries, LLC
- Jan Lucie Axel Lettens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process variation as die level traceability
- Patent number 10,685,918
- Issue date Jun 16, 2020
- Semiconductor Components Industries, LLC
- Jan Lucie Axel Lettens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to improve analog fault coverage using test diodes
- Patent number 10,103,074
- Issue date Oct 16, 2018
- Semiconductor Components Industries, LLC
- Ronny Vanhooren
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PROCESS VARIATION AS DIE LEVEL TRACEABILITY
- Publication number 20200258844
- Publication date Aug 13, 2020
- Semiconductor Components Industries, LLC
- Jan Lucie Axel LETTENS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS VARIATION AS DIE LEVEL TRACEABILITY
- Publication number 20200075499
- Publication date Mar 5, 2020
- Semiconductor Components Industries, LLC
- Jan Lucie Axel LETTENS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO IMPROVE ANALOG FAULT COVERAGE USING TEST DIODES
- Publication number 20170077003
- Publication date Mar 16, 2017
- Semiconductor Components Industries, LLC
- Ronny VANHOOREN
- G01 - MEASURING TESTING