Wing L. Lai

Person

Williston, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-composition gate dielectric field effect transistors
- Patent number 9,397,175
- Issue date Jul 19, 2016
- GLOBALFOUNDRIES Inc.
- Emre Alptekin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple thickness gate dielectrics for replacement gate field effe...
- Patent number 9,368,593
- Issue date Jun 14, 2016
- International Business Machines Corporation
- Unoh Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-composition gate dielectric field effect transistors
- Patent number 9,231,072
- Issue date Jan 5, 2016
- International Business Machines Corporation
- Emre Alptekin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple thickness gate dielectrics for replacement gate field effe...
- Patent number 9,224,826
- Issue date Dec 29, 2015
- International Business Machines Corporation
- Unoh Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field effect transistors having heteroepitaxial channels
- Patent number 9,190,406
- Issue date Nov 17, 2015
- International Business Machines Corporation
- Emre Alptekin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Annealing oxide gate dielectric layers for replacement metal gate f...
- Patent number 9,177,868
- Issue date Nov 3, 2015
- International Business Machines Corporation
- Unoh Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enabling enhanced reliability and mobility for replacement gate pla...
- Patent number 9,099,393
- Issue date Aug 4, 2015
- International Business Machines Corporation
- Takashi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Equivalent gate count yield estimation for integrated circuit devices
- Patent number 7,477,961
- Issue date Jan 13, 2009
- International Business Machines Corporation
- Thomas S. Barnett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of assessing potential for charging damage in SOI designs an...
- Patent number 7,132,318
- Issue date Nov 7, 2006
- International Business Machines Corporation
- Henry A. Bonges, III
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of assessing potential for charging damage in SOI designs an...
- Patent number 7,067,886
- Issue date Jun 27, 2006
- International Business Machines Corporation
- Henry A. Bonges, III
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MULTI-COMPOSITION GATE DIELECTRIC FIELD EFFECT TRANSISTORS
- Publication number 20160035841
- Publication date Feb 4, 2016
- International Business Machines Corporation
- Emre Alptekin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE THICKNESS GATE DIELECTRICS FOR REPLACEMENT GATE FIELD EFFE...
- Publication number 20160027893
- Publication date Jan 28, 2016
- International Business Machines Corporation
- Unoh Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANNEALING OXIDE GATE DIELECTRIC LAYERS FOR REPLACEMENT METAL GATE F...
- Publication number 20150279744
- Publication date Oct 1, 2015
- International Business Machines Corporation
- Unoh Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENABLING ENHANCED RELIABILITY AND MOBILITY FOR REPLACEMENT GATE PLA...
- Publication number 20150249015
- Publication date Sep 3, 2015
- International Business Machines Corporation
- Takashi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE THICKNESS GATE DIELECTRICS FOR REPLACEMENT GATE FIELD EFFE...
- Publication number 20150228747
- Publication date Aug 13, 2015
- International Business Machines Corporation
- Unoh Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-COMPOSITION GATE DIELECTRIC FIELD EFFECT TRANSISTORS
- Publication number 20150228748
- Publication date Aug 13, 2015
- International Business Machines Corporation
- Emre Alptekin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENABLING ENHANCED RELIABILITY AND MOBILITY FOR REPLACEMENT GATE PLA...
- Publication number 20150228749
- Publication date Aug 13, 2015
- International Business Machines Corporation
- Takashi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIN FIELD EFFECT TRANSISTORS HAVING HETEROEPITAXIAL CHANNELS
- Publication number 20150206876
- Publication date Jul 23, 2015
- International Business Machines Corporation
- Emre Alptekin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENABLING ENHANCED RELIABILITY AND MOBILITY FOR REPLACEMENT GATE PLA...
- Publication number 20150035073
- Publication date Feb 5, 2015
- GLOBALFOUNDRIES Inc.
- Takashi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20090112352
- Publication date Apr 30, 2009
- International Business Machines Corporation
- Thomas S. Barnett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR IMPROVED EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTE...
- Publication number 20070265722
- Publication date Nov 15, 2007
- International Business Machines Corporation
- Thomas S. Barnett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of assessing potential for charging damage in SOI designs an...
- Publication number 20050098799
- Publication date May 12, 2005
- Henry A. Bonges
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ASSESSING POTENTIAL FOR CHARGING DAMAGE IN SOI DESIGNS AN...
- Publication number 20050093072
- Publication date May 5, 2005
- International Business Machines Corporation
- Henry A. Bonges
- H01 - BASIC ELECTRIC ELEMENTS

Wing L. Lai

Person

Patents Grantslast 30 patents

Multi-composition gate dielectric field effect transistors

Multiple thickness gate dielectrics for replacement gate field effe...

Multi-composition gate dielectric field effect transistors

Multiple thickness gate dielectrics for replacement gate field effe...

Fin field effect transistors having heteroepitaxial channels

Annealing oxide gate dielectric layers for replacement metal gate f...

Enabling enhanced reliability and mobility for replacement gate pla...

Equivalent gate count yield estimation for integrated circuit devices

Method of assessing potential for charging damage in SOI designs an...

Method of assessing potential for charging damage in SOI designs an...

Patents Applicationslast 30 patents

MULTI-COMPOSITION GATE DIELECTRIC FIELD EFFECT TRANSISTORS

MULTIPLE THICKNESS GATE DIELECTRICS FOR REPLACEMENT GATE FIELD EFFE...

ANNEALING OXIDE GATE DIELECTRIC LAYERS FOR REPLACEMENT METAL GATE F...

ENABLING ENHANCED RELIABILITY AND MOBILITY FOR REPLACEMENT GATE PLA...

MULTIPLE THICKNESS GATE DIELECTRICS FOR REPLACEMENT GATE FIELD EFFE...

MULTI-COMPOSITION GATE DIELECTRIC FIELD EFFECT TRANSISTORS

ENABLING ENHANCED RELIABILITY AND MOBILITY FOR REPLACEMENT GATE PLA...

FIN FIELD EFFECT TRANSISTORS HAVING HETEROEPITAXIAL CHANNELS

ENABLING ENHANCED RELIABILITY AND MOBILITY FOR REPLACEMENT GATE PLA...

EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTEGRATED CIRCUIT DEVICES

METHOD FOR IMPROVED EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTE...

Method of assessing potential for charging damage in SOI designs an...

METHOD OF ASSESSING POTENTIAL FOR CHARGING DAMAGE IN SOI DESIGNS AN...