Woan Tyng Hwang

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Samma Chiu, TW

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Patents Grantslast 30 patents

Information Patent Grant
Test keys structure for a control monitor wafer
- Patent number 6,930,323
- Issue date Aug 16, 2005
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsien-Tsong Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimized monitor method for a metal patterning process
- Patent number 6,623,995
- Issue date Sep 23, 2003
- Taiwan Semiconductor Manufacturing Company
- Hsien-Tsong Chen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Optimized monitor method for a metal patterning process
- Publication number 20050037523
- Publication date Feb 17, 2005
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Hsien-Tsong Chen
- H01 - BASIC ELECTRIC ELEMENTS